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V62/04676-01XE PDF预览

V62/04676-01XE

更新时间： 2024-11-18 12:21:39
品牌 Logo 应用领域
德州仪器 - TI 总线驱动器总线收发器触发器逻辑集成电路光电二极管输出元件信息通信管理
页数 文件大小 规格书
10页 442K
描述
3.3-V ABT OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH 3-STATE OUTPUTS

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中文翻译

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V62/04676-01XE 技术参数

是否无铅：不含铅是否Rohs认证：符合
生命周期：Active零件包装代码：TSSOP
包装说明：TSSOP-20针数：20
Reach Compliance Code：compliantHTS代码：8542.39.00.01
Factory Lead Time：6 weeks风险等级：5.34
Is Samacsys：N计数方向：UNIDIRECTIONAL
系列：LVTJESD-30 代码：R-PDSO-G20
JESD-609代码：e4长度：6.5 mm
负载电容（CL）：50 pF逻辑集成电路类型：BUS DRIVER
最大频率@ Nom-Sup：150000000 Hz最大I（ol）：0.064 A
湿度敏感等级：1位数：8
功能数量：1端口数量：2
端子数量：20最高工作温度：85 °C
最低工作温度：-40 °C输出特性：3-STATE
输出极性：TRUE封装主体材料：PLASTIC/EPOXY
封装代码：TSSOP封装等效代码：TSSOP20,.25
封装形状：RECTANGULAR封装形式：SMALL OUTLINE, THIN PROFILE, SHRINK PITCH
包装方法：TR峰值回流温度（摄氏度）：260
电源：3.3 V最大电源电流（ICC）：5 mA
Prop。Delay @ Nom-Sup：4.5 ns传播延迟（tpd）：5 ns
认证状态：Not Qualified座面最大高度：1.2 mm
子类别：FF/Latches最大供电电压 (Vsup)：3.6 V
最小供电电压 (Vsup)：2.7 V标称供电电压 (Vsup)：3.3 V
表面贴装：YES技术：BICMOS
温度等级：INDUSTRIAL端子面层：Nickel/Palladium/Gold (Ni/Pd/Au)
端子形式：GULL WING端子节距：0.65 mm
端子位置：DUAL处于峰值回流温度下的最长时间：NOT SPECIFIED
翻译：N/A触发器类型：POSITIVE EDGE
宽度：4.4 mmBase Number Matches：1

V62/04676-01XE 数据手册

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SCBS771 − NOVEMBER 2003  
D
D
D
D
D
Controlled Baseline  
− One Assembly/Test Site, One Fabrication  
Site  
D
Bus Hold on Data Inputs Eliminates the  
Need for External Pullup/Pulldown  
Resistors  
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
D
D
Latch-Up Performance Exceeds 500 mA Per  
JESD 17  
Enhanced Product-Change Notification  
ESD Protection Exceeds JESD 22  
− 2000-V Human-Body Model (A114-A)  
− 200-V Machine Model (A115-A)  
†
Qualification Pedigree  
Supports Mixed-Mode Signal Operation  
(5-V Input and Output Voltages With  
PW PACKAGE  
(TOP VIEW)  
3.3-V V  
)
CC  
D
D
D
Typical V  
<0.8 V at V  
(Output Ground Bounce)  
= 3.3 V, T = 25°C  
A
OLP  
CC  
1
2
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4
5
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7
8
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10  
20  
19  
18  
17  
16  
15  
14  
13  
12  
11  
OE  
1Q  
1D  
2D  
2Q  
3Q  
3D  
4D  
4Q  
V
CC  
Supports Unregulated Battery Operation  
Down to 2.7 V  
8Q  
8D  
7D  
7Q  
6Q  
6D  
5D  
5Q  
CLK  
I
and Power-Up 3-State Support Hot  
off  
Insertion  
†
Component qualification in accordance with JEDEC and industry  
standards to ensure reliable operation over an extended  
temperature range. This includes, but is not limited to, Highly  
Accelerated Stress Test (HAST) or biased 85/85, temperature  
cycle, autoclave or unbiased HAST, electromigration, bond  
intermetallic life, and mold compound life. Such qualification  
testing should not be viewed as justifying use of this component  
beyond specified performance and environmental limits.  
GND  
description/ordering information  
This octal flip-flop is designed specifically for low-voltage (3.3-V) V  
a TTL interface to a 5-V system environment.  
operation, but with the capability to provide  
CC  
The eight flip-flops of the SN74LVTH374 are edge-triggered D-type flip-flops. On the positive transition of the  
clock (CLK) input, the Q outputs are set to the logic levels set up at the data (D) inputs.  
A buffered output-enable (OE) input can be used to place the eight outputs in either a normal logic state (high  
or low logic levels) or the high-impedance state. In the high-impedance state, the outputs neither load nor drive  
the bus lines significantly. The high-impedance state and increased drive provide the capability to drive bus  
lines without need for interface or pullup components.  
OE does not affect the internal operations of the flip-flops. Old data can be retained or new data can be entered  
while the outputs are in the high-impedance state.  
When V  
is between 0 and 1.5 V, the devices are in the high-impedance state during power up or power down.  
CC  
However, to ensure the high-impedance state above 1.5 V, OE should be tied to V  
the minimum value of the resistor is determined by the current-sinking capability of the driver.  
through a pullup resistor;  
CC  
Active bus-hold circuitry holds unused or undriven inputs at a valid logic state. Use of pullup or pulldown resistors  
with the bus-hold circuitry is not recommended.  
This device is fully specified for hot-insertion applications using I and power-up 3-state. The I circuitry  
off  
off  
disables the outputs, preventing damaging current backflow through the device when it is powered down. The  
power-up 3-state circuitry places the outputs in the high-impedance state during power up and power down,  
which prevents driver conflict.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
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Copyright 2003, Texas Instruments Incorporated  
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1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...10

中文翻译

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V62/04676-01XE 替代型号

型号 品牌 替代类型 描述 数据表
SN74LVTH374IPWREP TI

完全替代

 3.3-V ABT OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH 3-STATE OUTPUTS
SN74LVTH374PW TI

完全替代

 3.3 V ABT OCTAL EDGE TRIGGERED D TYPE FLIP FLOPS WITH 3 STATE OUTPUTS
SN74LVTH374PWR TI

类似代替

 3.3 V ABT OCTAL EDGE TRIGGERED D TYPE FLIP FLOPS WITH 3 STATE OUTPUTS

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