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V62/04670-02XE PDF预览

V62/04670-02XE

更新时间: 2024-11-18 12:17:03
品牌 Logo 应用领域
德州仪器 - TI 栅极触发器逻辑集成电路石英晶振光电二极管输入元件
页数 文件大小 规格书
11页 534K
描述
QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE

V62/04670-02XE 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active零件包装代码:SOIC
包装说明:SOP, SOP14,.25针数:14
Reach Compliance Code:compliantHTS代码:8542.39.00.01
Factory Lead Time:6 weeks风险等级:5.14
系列:LVC/LCX/ZJESD-30 代码:R-PDSO-G14
JESD-609代码:e4长度:8.65 mm
负载电容(CL):50 pF逻辑集成电路类型:XOR GATE
最大I(ol):0.024 A湿度敏感等级:1
功能数量:4输入次数:2
端子数量:14最高工作温度:125 °C
最低工作温度:-55 °C封装主体材料:PLASTIC/EPOXY
封装代码:SOP封装等效代码:SOP14,.25
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
包装方法:TR峰值回流温度(摄氏度):260
电源:3.3 V最大电源电流(ICC):0.01 mA
Prop。Delay @ Nom-Sup:4.6 ns传播延迟(tpd):5.6 ns
认证状态:Not Qualified施密特触发器:NO
座面最大高度:1.75 mm子类别:Gates
最大供电电压 (Vsup):3.6 V最小供电电压 (Vsup):2 V
标称供电电压 (Vsup):2.7 V表面贴装:YES
技术:CMOS温度等级:MILITARY
端子面层:Nickel/Palladium/Gold (Ni/Pd/Au)端子形式:GULL WING
端子节距:1.27 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:3.91 mm
Base Number Matches:1

V62/04670-02XE 数据手册

 浏览型号V62/04670-02XE的Datasheet PDF文件第2页浏览型号V62/04670-02XE的Datasheet PDF文件第3页浏览型号V62/04670-02XE的Datasheet PDF文件第4页浏览型号V62/04670-02XE的Datasheet PDF文件第5页浏览型号V62/04670-02XE的Datasheet PDF文件第6页浏览型号V62/04670-02XE的Datasheet PDF文件第7页 
SN74LVC86A-EP  
QUADRUPLE 2-INPUT EXCLUSIVE-OR GATE  
www.ti.com  
SCAS752BDECEMBER 2003REVISED JULY 2007  
FEATURES  
Controlled Baseline  
Max tpd of 4.6 ns at 3.3 V  
One Assembly/Test Site, One Fabrication  
Site  
Typical VOLP (Output Ground Bounce) <0.8 V  
at VCC = 3.3 V, TA = 25°C  
Extended Temperature Performance of –40°C  
to 125°C and –55°C to 125°C  
Typical VOHV (Output VOH Undershoot) >2 V at  
VCC = 3.3 V, TA = 25°C  
Enhanced Diminishing Manufacturing Sources  
(DMS) Support  
D OR PW PACKAGE  
(TOP VIEW)  
Enhanced Product-Change Notification  
(1)  
14  
13  
12  
11  
10  
9
1
2
3
4
5
6
7
1A  
1B  
V
CC  
Qualification Pedigree  
4B  
4A  
4Y  
3B  
3A  
3Y  
Operates From 2 V to 3.6 V  
1Y  
2A  
2B  
2Y  
Inputs Accept Voltages to 5.5 V  
(1) Component qualification in accordance with JEDEC and  
industry standards to ensure reliable operation over an  
extended temperature range. This includes, but is not limited  
to, Highly Accelerated Stress Test (HAST) or biased 85/85,  
temperature cycle, autoclave or unbiased HAST,  
8
GND  
electromigration, bond intermetallic life, and mold compound  
life. Such qualification testing should not be viewed as  
justifying use of this component beyond specified  
performance and environmental limits.  
DESCRIPTION/ORDERING INFORMATION  
The SN74LVC86A quadruple 2-input exclusive-OR gate is designed for 2.7-V to 3.6-V VCC operation.  
The device performs the Boolean function Y = A B or Y = AB + AB in positive logic.  
A common application is as a true/complement element. If one of the inputs is low, the other input is reproduced  
in true form at the output. If one of the inputs is high, the signal on the other input is reproduced inverted at the  
output.  
Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in  
a mixed 3.3-V/5-V system environment.  
ORDERING INFORMATION(1)  
TA  
PACKAGE(2)  
ORDERABLE PART NUMBER  
SN74LVC86AQDREP  
TOP-SIDE MARKING  
LVC86AE  
SOIC – D  
Reel of 2500  
–40°C to 125°C  
–55°C to 125°C  
TSSOP – PW  
SOIC – D  
Reel of 2000  
Reel of 2500  
SN74LVC86AQPWREP  
SN74LVC86AMDREP  
LVC86AE  
LVC86AM  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
website at www.ti.com.  
(2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.  
FUNCTION TABLE  
(EACH GATE)  
INPUTS  
OUTPUT  
Y
A
L
B
L
L
H
H
L
L
H
L
H
H
H
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2003–2007, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  

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