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V62/04655-01YE PDF预览

V62/04655-01YE

更新时间: 2024-11-20 12:47:19
品牌 Logo 应用领域
德州仪器 - TI 栅极触发器逻辑集成电路光电二极管输入元件
页数 文件大小 规格书
13页 542K
描述
QUADRUPLE 2-INPUT POSITIVE-AND GATE

V62/04655-01YE 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active零件包装代码:TSSOP
包装说明:TSSOP-14针数:14
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.39.00.01Factory Lead Time:6 weeks
风险等级:5.15Is Samacsys:N
系列:LVC/LCX/ZJESD-30 代码:R-PDSO-G14
JESD-609代码:e4长度:5 mm
负载电容(CL):50 pF逻辑集成电路类型:AND GATE
最大I(ol):0.024 A湿度敏感等级:1
功能数量:4输入次数:2
端子数量:14最高工作温度:125 °C
最低工作温度:-40 °C封装主体材料:PLASTIC/EPOXY
封装代码:TSSOP封装等效代码:TSSOP14,.25
封装形状:RECTANGULAR封装形式:SMALL OUTLINE, THIN PROFILE, SHRINK PITCH
包装方法:TR峰值回流温度(摄氏度):260
电源:3.3 V最大电源电流(ICC):0.01 mA
Prop。Delay @ Nom-Sup:4.1 ns传播延迟(tpd):4.8 ns
认证状态:Not Qualified施密特触发器:NO
座面最大高度:1.2 mm子类别:Gates
最大供电电压 (Vsup):3.6 V最小供电电压 (Vsup):2 V
标称供电电压 (Vsup):2.7 V表面贴装:YES
技术:CMOS温度等级:AUTOMOTIVE
端子面层:Nickel/Palladium/Gold (Ni/Pd/Au)端子形式:GULL WING
端子节距:0.65 mm端子位置:DUAL
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:4.4 mm
Base Number Matches:1

V62/04655-01YE 数据手册

 浏览型号V62/04655-01YE的Datasheet PDF文件第2页浏览型号V62/04655-01YE的Datasheet PDF文件第3页浏览型号V62/04655-01YE的Datasheet PDF文件第4页浏览型号V62/04655-01YE的Datasheet PDF文件第5页浏览型号V62/04655-01YE的Datasheet PDF文件第6页浏览型号V62/04655-01YE的Datasheet PDF文件第7页 
SN74LVC08A-EP  
QUADRUPLE 2-INPUT POSITIVE-AND GATE  
www.ti.com  
SCAS731DNOVEMBER 2003REVISED SEPTEMBER 2007  
1
FEATURES  
Typical VOLP (Output Ground Bounce) <0.8 V at  
VCC = 3.3 V, TA = 25°C  
Controlled Baseline  
Typical VOHV (Output VOH Undershoot) >2 V at  
VCC = 3.3 V, TA = 25°C  
One Assembly  
One Test Site  
One Fabrication Site  
D OR PW PACKAGE  
(TOP VIEW)  
Extended Temperature Performance of –40°C  
to 125°C and –55°C to 125°C  
1
2
3
4
5
6
7
14  
13  
12  
11  
10  
9
1A  
1B  
VCC  
4B  
4A  
4Y  
3B  
3A  
3Y  
Enhanced Diminishing Manufacturing Sources  
(DMS) Support  
1Y  
2A  
2B  
2Y  
Enhanced Product-Change Notification  
Qualification Pedigree  
Component qualification in accordance with JEDEC and industry  
standards to ensure reliable operation over an extended  
temperature range. This includes, but is not limited to, Highly  
Accelerated Stress Test (HAST) or biased 85/85, temperature  
cycle, autoclave or unbiased HAST, electromigration, bond  
intermetallic life, and mold compound life. Such qualification testing  
should not be viewed as justifying use of this component beyond  
specified  
8
GND  
performance and environmental limits.  
ESD Protection Exceeds 2000 V Per  
MIL-STD-883, Method 3015; Exceeds 200 V  
Using Machine Model (C = 200 pF, R = 0)  
Operates From 1.65 V to 3.6 V  
Inputs Accept Voltages to 5.5 V  
Max tpd of 4.1 ns at 3.3 V  
DESCRIPTION/ORDERING INFORMATION  
The SN74LVC08A quadruple 2-input positive-AND gate is designed for 2.7-V to 3.6-V VCC operation.  
Y + A B or Y + A ) B  
The device performs the Boolean function in  
positive logic.  
Inputs can be driven from either 3.3 V or 5 V devices. This feature allows the use of this device as a translator in  
a mixed 3.3 V/5 V system environment.  
ORDERING INFORMATION(1)  
TA  
PACKAGE(2)  
ORDERABLE PART NUMBER  
SN74LVC08AQDREP  
TOP-SIDE MARKING  
LVC08AE  
SOIC – D  
Reel of 2500  
–40°C to 125°C  
TSSOP – PW  
SOIC – D  
Reel of 2000  
Reel of 2500  
Reel of 2000  
SN74LVC08AQPWREP  
SN74LVC08AMDREP  
LVC08AE  
LVC08AM  
LVC08AM  
–55°C to 125°C  
TSSOP – PW  
SN74LVC08AMPWREP  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
website at www.ti.com.  
(2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2003–2007, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  

V62/04655-01YE 替代型号

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