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V62/04652-01YE PDF预览

V62/04652-01YE

更新时间: 2024-11-21 12:17:03
品牌 Logo 应用领域
德州仪器 - TI 栅极触发器逻辑集成电路光电二极管输入元件
页数 文件大小 规格书
12页 523K
描述
QUADRUPLE 2-INPUT POSITIVE-NAND GATE

V62/04652-01YE 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active零件包装代码:TSSOP
包装说明:TSSOP-14针数:14
Reach Compliance Code:compliantHTS代码:8542.39.00.01
Factory Lead Time:6 weeks风险等级:5.22
Is Samacsys:N系列:LVC/LCX/Z
JESD-30 代码:R-PDSO-G14JESD-609代码:e4
长度:5 mm负载电容(CL):50 pF
逻辑集成电路类型:NAND GATE最大I(ol):0.024 A
湿度敏感等级:1功能数量:4
输入次数:2端子数量:14
最高工作温度:125 °C最低工作温度:-40 °C
封装主体材料:PLASTIC/EPOXY封装代码:TSSOP
封装等效代码:TSSOP14,.25封装形状:RECTANGULAR
封装形式:SMALL OUTLINE, THIN PROFILE, SHRINK PITCH包装方法:TR
峰值回流温度(摄氏度):260电源:3.3 V
最大电源电流(ICC):0.01 mAProp。Delay @ Nom-Sup:4.3 ns
传播延迟(tpd):5.1 ns认证状态:Not Qualified
施密特触发器:NO座面最大高度:1.2 mm
子类别:Gates最大供电电压 (Vsup):3.6 V
最小供电电压 (Vsup):2 V标称供电电压 (Vsup):3.3 V
表面贴装:YES技术:CMOS
温度等级:AUTOMOTIVE端子面层:Nickel/Palladium/Gold (Ni/Pd/Au)
端子形式:GULL WING端子节距:0.65 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:4.4 mmBase Number Matches:1

V62/04652-01YE 数据手册

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SN74LVC00A-EP  
QUADRUPLE 2-INPUT POSITIVE-NAND GATE  
www.ti.com  
SCAS729BNOVEMBER 2003REVISED MARCH 2007  
FEATURES  
Typical VOLP (Output Ground Bounce)  
<0.8 V at VCC = 3.3 V, TA = 25°C  
Controlled Baseline  
Typical VOHV (Output VOH Undershoot)  
>2 V at VCC = 3.3 V, TA = 25°C  
One Assembly/Test Site, One Fabrication  
Site  
Extended Temperature Performance of –40°C  
to 125°C and –55°C to 125°C  
D OR PW PACKAGE  
(TOP VIEW)  
Enhanced Diminishing Manufacturing Sources  
(DMS) Support  
1
2
3
4
5
6
7
14  
13  
12  
11  
10  
9
1A  
1B  
V
CC  
4B  
4A  
4Y  
3B  
3A  
3Y  
Enhanced Product-Change Notification  
1Y  
2A  
2B  
2Y  
(1)  
Qualification Pedigree  
ESD Protection Exceeds 2000 V Per  
MIL-STD-883, Method 3015; Exceeds 200 V  
Using Machine Model (C = 200 pF, R = 0)  
8
GND  
Operates From 2 V to 3.6 V  
Inputs Accept Voltages to 5.5 V  
Max tpd of 4.3 ns at 3.3 V  
(1) Component qualification in accordance with JEDEC and  
industry standards to ensure reliable operation over an  
extended temperature range. This includes, but is not limited  
to, Highly Accelerated Stress Test (HAST) or biased 85/85,  
temperature cycle, autoclave or unbiased HAST,  
electromigration, bond intermetallic life, and mold compound  
life. Such qualification testing should not be viewed as  
justifying use of this component beyond specified  
performance and environmental limits.  
DESCRIPTION/ORDERING INFORMATION  
The SN74LVC00A quadruple 2-input positive-NAND gate is designed for 2.7-V to 3.6-V VCC operation.  
The device performs the Boolean function Y = A B or Y = A + B in positive logic.  
Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in  
a mixed 3.3-V/5-V system environment.  
ORDERING INFORMATION(1)  
TA  
PACKAGE(2)  
ORDERABLE PART NUMBER  
SN74LVC00AQDREP  
TOP-SIDE MARKING  
LVC00AE  
SOIC – D  
Reel of 2500  
–40 °C to 125 °C  
–55 °C to 125 °C  
TSSOP – PW  
TSSOP – PW  
Reel of 2000  
Reel of 2000  
SN74LVC00AQPWREP  
SN74LVC00AMPWREP  
LVC00AE  
LVC00AM  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
Web site at www.ti.com.  
(2) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at  
www.ti.com/sc/package.  
FUNCTION TABLE  
(EACH GATE)  
INPUTS  
OUTPUT  
Y
A
H
L
B
H
X
L
L
H
H
X
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2003–2007, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
On products compliant to MIL-PRF-38535, all parameters are  
Instruments standard warranty. Production processing does not  
tested unless otherwise noted. On all other products, production  
necessarily include testing of all parameters.  
processing does not necessarily include testing of all parameters.  

V62/04652-01YE 替代型号

型号 品牌 替代类型 描述 数据表
SN74LVC00AQPWRQ1 TI

完全替代

QUADRUPLE 2-INPUT POSITIVE-NAND GATE
SN74LVC00AMPWREP TI

类似代替

Enhanced Product Quadruple 2-Input Positive-Nand Gate 14-TSSOP -55 to 125
SN74LVC00AQPWREP TI

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暂无描述

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