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SGUS046 − JULY 2003
D
Controlled Baseline
− One Assembly/Test Site, One Fabrication
Site
D
Block-Memory-Move Instructions for Better
Program and Data Management
D
D
D
D
D
D
Instructions With a 32-Bit Long Word
Operand
D
D
D
D
D
Extended Temperature Performance of
−40°C to 100°C
Enhanced Diminishing Manufacturing
Sources (DMS) Support
Instructions With Two- or Three-Operand
Reads
Arithmetic Instructions With Parallel Store
and Parallel Load
Enhanced Product-Change Notification
†
Qualification Pedigree
Conditional Store Instructions
Fast Return From Interrupt
Advanced Multibus Architecture With Three
Separate 16-Bit Data Memory Buses and
One Program Memory Bus
On-Chip Peripherals
− Software-Programmable Wait-State
Generator and Programmable Bank
Switching
− On-Chip Phase-Locked Loop (PLL) Clock
Generator With Internal Oscillator or
External Clock Source
− Three Multichannel Buffered Serial Ports
(McBSPs)
− Enhanced 8-Bit Parallel Host-Port
Interface With 16-Bit Data/Addressing
− One 16-Bit Timer
D
D
40-Bit Arithmetic Logic Unit (ALU),
Including a 40-Bit Barrel Shifter and Two
Independent 40-Bit Accumulators
17- × 17-Bit Parallel Multiplier Coupled to a
40-Bit Dedicated Adder for Non-Pipelined
Single-Cycle Multiply/Accumulate (MAC)
Operation
D
D
D
Compare, Select, and Store Unit (CSSU) for
the Add/Compare Selection of the Viterbi
Operator
− Six-Channel Direct Memory Access
(DMA) Controller
Exponent Encoder to Compute an
Exponent Value of a 40-Bit Accumulator
Value in a Single Cycle
D
Power Consumption Control With IDLE1,
IDLE2, and IDLE3 Instructions With
Power-Down Modes
Two Address Generators With Eight
Auxiliary Registers and Two Auxiliary
Register Arithmetic Units (ARAUs)
D
D
CLKOUT Off Control to Disable CLKOUT
On-Chip Scan-Based Emulation Logic,
D
D
Data Bus With a Bus-Holder Feature
‡
IEEE Std 1149.1 (JTAG) Boundary Scan
Extended Addressing Mode for 8M × 16-Bit
Maximum Addressable External Program
Space
Logic
D
D
10-ns Single-Cycle Fixed-Point Instruction
Execution Time (100 MIPS) for 3.3-V Power
Supply (1.8-V Core)
D
D
D
16K x 16-Bit On-Chip ROM
32K x 16-Bit Dual-Access On-Chip RAM
Available in a 144-Pin Ball Grid Array (BGA)
(GGU Suffix)
Single-Instruction-Repeat and
Block-Repeat Operations for Program Code
NOTE:This data sheet is designed to be used in conjunction with the TMS320C5000 DSP Family Functional Overview
(literature number SPRU307).
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
†
‡
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range.
This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST,
electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this
component beyond specified performance and environmental limits.
IEEE Standard 1149.1-1990 Standard-Test-Access Port and Boundary Scan Architecture.
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Copyright 2003, Texas Instruments Incorporated
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