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V62/04649-01XA PDF预览

V62/04649-01XA

更新时间: 2024-11-20 12:21:47
品牌 Logo 应用领域
德州仪器 - TI 微控制器和处理器外围集成电路数字信号处理器时钟
页数 文件大小 规格书
78页 1044K
描述
FIXED-POINT DIGITAL SIGNAL PROCESSOR

V62/04649-01XA 技术参数

是否无铅: 含铅是否Rohs认证: 不符合
生命周期:Obsolete零件包装代码:BGA
包装说明:LFBGA, BGA144,13X13,32针数:144
Reach Compliance Code:not_compliantECCN代码:3A001.A.2.C
HTS代码:8542.31.00.01风险等级:5.92
其他特性:ALSO REQUIRES 3.3V SUPPLY地址总线宽度:23
桶式移位器:YES位大小:16
边界扫描:YES最大时钟频率:20 MHz
外部数据总线宽度:16格式:FIXED POINT
内部总线架构:MULTIPLEJESD-30 代码:S-PBGA-B144
JESD-609代码:e0长度:12 mm
低功率模式:YES湿度敏感等级:3
端子数量:144最高工作温度:100 °C
最低工作温度:-40 °C封装主体材料:PLASTIC/EPOXY
封装代码:LFBGA封装等效代码:BGA144,13X13,32
封装形状:SQUARE封装形式:GRID ARRAY, LOW PROFILE, FINE PITCH
峰值回流温度(摄氏度):220电源:1.8,3.3 V
认证状态:Not QualifiedRAM(字数):32768
座面最大高度:1.4 mm子类别:Digital Signal Processors
最大供电电压:1.98 V最小供电电压:1.71 V
标称供电电压:1.8 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:Tin/Lead (Sn/Pb)端子形式:BALL
端子节距:0.8 mm端子位置:BOTTOM
处于峰值回流温度下的最长时间:NOT SPECIFIED宽度:12 mm
uPs/uCs/外围集成电路类型:DIGITAL SIGNAL PROCESSOR, OTHERBase Number Matches:1

V62/04649-01XA 数据手册

 浏览型号V62/04649-01XA的Datasheet PDF文件第2页浏览型号V62/04649-01XA的Datasheet PDF文件第3页浏览型号V62/04649-01XA的Datasheet PDF文件第4页浏览型号V62/04649-01XA的Datasheet PDF文件第5页浏览型号V62/04649-01XA的Datasheet PDF文件第6页浏览型号V62/04649-01XA的Datasheet PDF文件第7页 
ꢀꢁ ꢂ ꢃ ꢄ ꢅ ꢆꢇ ꢈꢄꢉ ꢊꢋ ꢌ  
ꢍ ꢎꢏ ꢋꢐꢊꢌꢑ ꢎ ꢒꢓ ꢐꢎ ꢔꢎ ꢓꢕꢖ ꢀꢎ ꢔ ꢒꢕꢖ ꢌꢗ ꢑ ꢆꢋ ꢀ ꢀꢑ ꢗ  
SGUS046 − JULY 2003  
D
Controlled Baseline  
− One Assembly/Test Site, One Fabrication  
Site  
D
Block-Memory-Move Instructions for Better  
Program and Data Management  
D
D
D
D
D
D
Instructions With a 32-Bit Long Word  
Operand  
D
D
D
D
D
Extended Temperature Performance of  
−40°C to 100°C  
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
Instructions With Two- or Three-Operand  
Reads  
Arithmetic Instructions With Parallel Store  
and Parallel Load  
Enhanced Product-Change Notification  
Qualification Pedigree  
Conditional Store Instructions  
Fast Return From Interrupt  
Advanced Multibus Architecture With Three  
Separate 16-Bit Data Memory Buses and  
One Program Memory Bus  
On-Chip Peripherals  
− Software-Programmable Wait-State  
Generator and Programmable Bank  
Switching  
− On-Chip Phase-Locked Loop (PLL) Clock  
Generator With Internal Oscillator or  
External Clock Source  
− Three Multichannel Buffered Serial Ports  
(McBSPs)  
− Enhanced 8-Bit Parallel Host-Port  
Interface With 16-Bit Data/Addressing  
− One 16-Bit Timer  
D
D
40-Bit Arithmetic Logic Unit (ALU),  
Including a 40-Bit Barrel Shifter and Two  
Independent 40-Bit Accumulators  
17- × 17-Bit Parallel Multiplier Coupled to a  
40-Bit Dedicated Adder for Non-Pipelined  
Single-Cycle Multiply/Accumulate (MAC)  
Operation  
D
D
D
Compare, Select, and Store Unit (CSSU) for  
the Add/Compare Selection of the Viterbi  
Operator  
− Six-Channel Direct Memory Access  
(DMA) Controller  
Exponent Encoder to Compute an  
Exponent Value of a 40-Bit Accumulator  
Value in a Single Cycle  
D
Power Consumption Control With IDLE1,  
IDLE2, and IDLE3 Instructions With  
Power-Down Modes  
Two Address Generators With Eight  
Auxiliary Registers and Two Auxiliary  
Register Arithmetic Units (ARAUs)  
D
D
CLKOUT Off Control to Disable CLKOUT  
On-Chip Scan-Based Emulation Logic,  
D
D
Data Bus With a Bus-Holder Feature  
IEEE Std 1149.1 (JTAG) Boundary Scan  
Extended Addressing Mode for 8M × 16-Bit  
Maximum Addressable External Program  
Space  
Logic  
D
D
10-ns Single-Cycle Fixed-Point Instruction  
Execution Time (100 MIPS) for 3.3-V Power  
Supply (1.8-V Core)  
D
D
D
16K x 16-Bit On-Chip ROM  
32K x 16-Bit Dual-Access On-Chip RAM  
Available in a 144-Pin Ball Grid Array (BGA)  
(GGU Suffix)  
Single-Instruction-Repeat and  
Block-Repeat Operations for Program Code  
NOTE:This data sheet is designed to be used in conjunction with the TMS320C5000 DSP Family Functional Overview  
(literature number SPRU307).  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range.  
This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST,  
electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this  
component beyond specified performance and environmental limits.  
IEEE Standard 1149.1-1990 Standard-Test-Access Port and Boundary Scan Architecture.  
ꢓꢤ  
Copyright 2003, Texas Instruments Incorporated  
ꢠ ꢤ ꢡ ꢠꢙ ꢚꢮ ꢜꢛ ꢟ ꢧꢧ ꢥꢟ ꢝ ꢟ ꢞ ꢤ ꢠ ꢤ ꢝ ꢡ ꢩ  
1
POST OFFICE BOX 1443 HOUSTON, TEXAS 77251−1443  

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