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V62/04620-01XE PDF预览

V62/04620-01XE

更新时间: 2024-09-14 03:21:07
品牌 Logo 应用领域
德州仪器 - TI 驱动器输出元件
页数 文件大小 规格书
10页 386K
描述
OCTAL BUFFER/DRIVER WITH 3-STATE OUTPUTS

V62/04620-01XE 技术参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Active零件包装代码:SOIC
包装说明:SOP, SOP20,.4针数:20
Reach Compliance Code:compliantECCN代码:EAR99
HTS代码:8542.39.00.01Factory Lead Time:1 week
风险等级:5.27控制类型:ENABLE LOW
计数方向:UNIDIRECTIONAL系列:ACT
JESD-30 代码:R-PDSO-G20JESD-609代码:e4
长度:12.8 mm负载电容(CL):50 pF
逻辑集成电路类型:BUS DRIVER最大I(ol):0.024 A
湿度敏感等级:1位数:4
功能数量:2端口数量:2
端子数量:20最高工作温度:125 °C
最低工作温度:-55 °C输出特性:3-STATE
输出极性:TRUE封装主体材料:PLASTIC/EPOXY
封装代码:SOP封装等效代码:SOP20,.4
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
包装方法:TR峰值回流温度(摄氏度):260
电源:5 V最大电源电流(ICC):0.04 mA
Prop。Delay @ Nom-Sup:10 ns传播延迟(tpd):10 ns
认证状态:Not Qualified座面最大高度:2.65 mm
子类别:Bus Driver/Transceivers最大供电电压 (Vsup):5.5 V
最小供电电压 (Vsup):4.5 V标称供电电压 (Vsup):5 V
表面贴装:YES技术:CMOS
温度等级:MILITARY端子面层:Nickel/Palladium/Gold (Ni/Pd/Au)
端子形式:GULL WING端子节距:1.27 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
翻译:N/A宽度:7.5 mm

V62/04620-01XE 数据手册

 浏览型号V62/04620-01XE的Datasheet PDF文件第2页浏览型号V62/04620-01XE的Datasheet PDF文件第3页浏览型号V62/04620-01XE的Datasheet PDF文件第4页浏览型号V62/04620-01XE的Datasheet PDF文件第5页浏览型号V62/04620-01XE的Datasheet PDF文件第6页浏览型号V62/04620-01XE的Datasheet PDF文件第7页 
SN74ACT244-EP  
OCTAL BUFFER/DRIVER  
WITH 3-STATE OUTPUTS  
www.ti.com  
SCAS724BOCTOBER 2003REVISED MARCH 2006  
FEATURES  
Controlled Baseline  
DW OR NS PACKAGE  
(TOP VIEW)  
– One Assembly/Test Site, One Fabrication  
Site  
1
2
3
4
5
6
7
8
9
10  
20  
19  
18  
17  
16  
15  
14  
13  
12  
11  
1OE  
1A1  
2Y4  
1A2  
2Y3  
1A3  
2Y2  
1A4  
2Y1  
GND  
V
CC  
Extended Temperature Performance of up to  
–55°C to 125°C  
2OE  
1Y1  
2A4  
1Y2  
2A3  
1Y3  
2A2  
1Y4  
2A1  
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
Enhanced Product-Change Notification  
(1)  
Qualification Pedigree  
4.5-V to 5.5-V VCC Operation  
Inputs Accept Voltages to 5.5 V  
Max tpd of 9.5 ns at 5 V  
Inputs Are TTL Compatible  
(1) Component qualification in accordance with JEDEC and  
industry standards to ensure reliable operation over an  
extended temperature range. This includes, but is not limited  
to, Highly Accelerated Stress Test (HAST) or biased 85/85,  
temperature cycle, autoclave or unbiased HAST,  
electromigration, bond intermetallic life, and mold compound  
life. Such qualification testing should not be viewed as  
justifying use of this component beyond specified  
performance and environmental limits.  
DESCRIPTION/ORDERING INFORMATION  
The SN74ACT244-EP octal buffer/driver is designed specifically to improve the performance and density of  
3-state memory address drivers, clock drivers, and bus-oriented receivers and transmitters.  
The device is organized as two 4-bit buffers/drivers with separate output-enable (OE) inputs. When OE is low,  
the device passes noninverted data from the A inputs to the Y outputs. When OE is high, the outputs are in the  
high-impedance state.  
To ensure the high-impedance state during power up or power down, OE should be tied to VCC through a pullup  
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.  
ORDERING INFORMATION  
TA  
–55°C to 125°C  
–40°C to 85°C  
PACKAGE(1)  
ORDERABLE PART NUMBER  
SN74ACT244MDWREP  
SN74ACT244MNSREP  
TOP-SIDE MARKING  
SACT244MEP  
SOIC – DW  
SOP – NS  
SOIC – DW  
Tape and reel  
Tape and reel  
Tape and reel  
SACT244MEP  
SN74ACT244IDWREP  
SACT244IEP  
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at  
www.ti.com/sc/package.  
FUNCTION TABLE  
(EACH BUFFER)  
INPUTS  
OUTPUT  
Y
OE  
L
A
H
L
H
L
L
H
X
Z
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2003–2006, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  

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