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V62/03648-01XE PDF预览

V62/03648-01XE

更新时间： 2024-01-30 01:27:21
品牌 Logo 应用领域
德州仪器 - TI 输出元件
页数 文件大小 规格书
9页 437K
描述
QUADRUPLE BUS BUFFER GATE WITH 3-STATE OUTPUTS

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V62/03648-01XE 技术参数

是否无铅：不含铅是否Rohs认证：符合
生命周期：Active零件包装代码：SOIC
包装说明：GREEN, SOIC-14针数：14
Reach Compliance Code：compliantHTS代码：8542.39.00.01
Factory Lead Time：6 weeks风险等级：5.19
Is Samacsys：N控制类型：ENABLE LOW
计数方向：UNIDIRECTIONAL系列：AHC/VHC/H/U/V
JESD-30 代码：R-PDSO-G14JESD-609代码：e4
长度：8.65 mm负载电容（CL）：50 pF
逻辑集成电路类型：BUS DRIVER最大I（ol）：0.05 A
湿度敏感等级：1位数：1
功能数量：4端口数量：2
端子数量：14最高工作温度：125 °C
最低工作温度：-55 °C输出特性：3-STATE
输出极性：TRUE封装主体材料：PLASTIC/EPOXY
封装代码：SOP封装等效代码：SOP14,.25
封装形状：RECTANGULAR封装形式：SMALL OUTLINE
包装方法：TR峰值回流温度（摄氏度）：260
电源：2/5.5 V最大电源电流（ICC）：0.04 mA
Prop。Delay @ Nom-Sup：8.5 ns传播延迟（tpd）：13 ns
认证状态：Not Qualified座面最大高度：1.75 mm
子类别：Bus Driver/Transceivers最大供电电压 (Vsup)：5.5 V
最小供电电压 (Vsup)：2 V标称供电电压 (Vsup)：3.3 V
表面贴装：YES技术：CMOS
温度等级：MILITARY端子面层：Nickel/Palladium/Gold (Ni/Pd/Au)
端子形式：GULL WING端子节距：1.27 mm
端子位置：DUAL处于峰值回流温度下的最长时间：NOT SPECIFIED
翻译：N/A宽度：3.91 mm
Base Number Matches：1

V62/03648-01XE 数据手册

 浏览型号V62/03648-01XE的Datasheet PDF文件第2页浏览型号V62/03648-01XE的Datasheet PDF文件第3页浏览型号V62/03648-01XE的Datasheet PDF文件第4页浏览型号V62/03648-01XE的Datasheet PDF文件第5页浏览型号V62/03648-01XE的Datasheet PDF文件第6页浏览型号V62/03648-01XE的Datasheet PDF文件第7页 
SN74AHC125-EP  
QUADRUPLE BUS BUFFER GATE  
WITH 3-STATE OUTPUTS  
SCLS485A – MAY 2003 – REVISED JUNE 2003  
D OR PW PACKAGE  
(TOP VIEW)  
Controlled Baseline  
– One Assembly/Test Site, One Fabrication  
Site  
1
2
3
4
5
6
7
14  
13  
12  
11  
10  
9
1OE  
1A  
1Y  
2OE  
2A  
2Y  
V
CC  
4OE  
Extended Temperature Performance of  
–55°C to 125°C  
4A  
4Y  
3OE  
3A  
3Y  
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
Enhanced Product-Change Notification  
†
8
GND  
Qualification Pedigree  
EPIC (Enhanced-Performance Implanted  
CMOS) Process  
Operating Range 2-V to 5.5-V V  
CC  
Latch-Up Performance Exceeds 250 mA Per  
JESD 17  
ESD Protection Exceeds 1000 V Per  
MIL-STD-833, Method 3015; Exceeds 150 V  
Using Machine Model (C = 200 pF, R = 0)  
†
Component qualification in accordance with JEDEC and industry  
standards to ensure reliable operation over an extended  
temperature range. This includes, but is not limited to, Highly  
Accelerated Stress Test (HAST) or biased 85/85, temperature  
cycle, autoclave or unbiased HAST, electromigration, bond  
intermetallic life, and mold compound life. Such qualification  
testing should not be viewed as justifying use of this component  
beyond specified performance and environmental limits.  
description/ordering information  
The SN74AHC125 is a quadruple bus buffer gate featuring independent line drivers with 3-state outputs. Each  
output is disabled when the associated output-enable (OE) input is high. When OE is low, the respective gate  
passes the data from the A input to its Y output.  
To ensure the high-impedance state during power up or power down, OE should be tied to V through a pullup  
CC  
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.  
ORDERING INFORMATION  
ORDERABLE  
PART NUMBER  
TOP-SIDE  
MARKING  
‡
PACKAGE  
T
A
SOIC – D  
Tape and reel  
Tape and reel  
SN74AHC125MDREP  
SN74AHC125MPWREP  
AHC125MEP  
AH125EP  
–55°C to 125°C  
TSSOP – PW  
‡
Packagedrawings,standardpackingquantities,thermaldata,symbolization,andPCBdesignguidelines  
are available at www.ti.com/sc/package.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
EPIC is a trademark of Texas Instruments.  
Copyright 2003, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...9

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