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UT8R512K8 PDF预览

UT8R512K8

更新时间: 2024-10-31 00:54:03
品牌 Logo 应用领域
艾法斯 - AEROFLEX 静态存储器
页数 文件大小 规格书
23页 236K
描述
UT8R512K8 512K x 8 SRAM

UT8R512K8 数据手册

 浏览型号UT8R512K8的Datasheet PDF文件第2页浏览型号UT8R512K8的Datasheet PDF文件第3页浏览型号UT8R512K8的Datasheet PDF文件第4页浏览型号UT8R512K8的Datasheet PDF文件第5页浏览型号UT8R512K8的Datasheet PDF文件第6页浏览型号UT8R512K8的Datasheet PDF文件第7页 
Standard Products  
UT8R512K8 512K x 8 SRAM  
Data Sheet  
March 2009  
www.aeroflex.com/memories  
FEATURES  
INTRODUCTION  
‰
‰
15ns maximum access time  
Asynchronous operation for compatibility with industry-  
standard 512K x 8 SRAMs  
The UT8R512K8 is a high-performance CMOS static RAM  
organized as 524,288 words by 8 bits. Easy memory expansion  
is provided by active LOW and HIGH chip enables (E1, E2), an  
active LOW output enable (G), and three-state drivers. This  
device has a power-down feature that reduces power  
consumption by more than 90% when deselected.  
‰
CMOS compatible inputs and output levels, three-state  
bidirectional data bus  
- I/O Voltage 3.3 volts, 1.8 volt core  
Operational environment:  
‰
- Intrinsic total-dose: 300K rad(Si)  
2
Writing to the device is accomplished by taking chip enable one  
(E1) input LOW, chip enable two (E2) HIGH and write enable  
(W) input LOW. Data on the eight I/O pins (DQ0 through DQ7)  
is then written into the location specified on the address pins  
(A0 through A18). Reading from the device is accomplished by  
taking chip enable one (E1) and output enable (G) LOW while  
forcing write enable(W) and chip enable two(E2) HIGH. Under  
these conditions, the contents of the memory location specified  
by the address pins will appear on the I/O pins.  
- SEL Immune >100 MeV-cm /mg  
2
- LET (0.25): 53.0 MeV-cm /mg  
th  
2
- Memory Cell Saturated Cross Section 1.67E-7cm /bit  
- Neutron Fluence: 3.0E14n/cm  
2
- Dose Rate  
- Upset 1.0E9 rad(Si)/sec  
- Latchup >1.0E11 rad(Si)/sec  
Packaging options:  
‰
‰
- 36-lead ceramic flatpack (3.762 grams)  
Standard Microcircuit Drawing 5962-03235  
- QML Q & Vcompliant part  
The eight input/output pins (DQ0 through DQ7) are placed in a  
high impedance state when the device is deselected (E1 HIGH  
or E2 LOW), the outputs are disabled (G HIGH), or during a  
write operation (E1 LOW, E2 HIGH and W LOW).  
INPUT  
DRIVER  
TOP/BOTTOM  
DECODER  
INPUT  
DRIVERS  
BLOCK  
DECODER  
A(18:0)  
ROW  
DECODER  
MEMORY  
ARRAY  
INPUT  
DRIVERS  
DATA  
WRITE  
CIRCUIT  
INPUT  
DRIVERS  
INPUT  
DRIVERS  
COLUMN  
DECODER  
COLUMN  
I/O  
DQ(7:0)  
E1  
E2  
OUTPUT  
DRIVERS  
DATA  
READ  
CIRCUIT  
CHIP ENABLE  
OUTPUT ENABLE  
WRITE ENABLE  
G
W
Figure 1. UT8R512K8 SRAM Block Diagram  

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