UC1825A-SP
www.ti.com ..................................................................................................................................................... SLUS873A–JANUARY 2009–REVISED APRIL 2009
RAD-TOLERANT CLASS-V, HIGH-SPEED PWM CONTROLLER
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FEATURES
DESCRIPTION
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QML-V Qualified, SMD 5962-87681
The UC1825A PWM controller is an improved version
of the standard UC1825 family. Performance
enhancements have been made to several of the
circuit blocks. Error amplifier gain bandwidth product
is 12 MHz, while input offset voltage is 2 mV. Current
limit threshold is assured to a tolerance of 5%.
Oscillator discharge current is specified at 10 mA for
accurate dead time control. Frequency accuracy is
improved to 6%. Startup supply current, typically 100
µA, is ideal for off-line applications. The output drivers
are redesigned to actively sink current during UVLO
at no expense to the startup current specification. In
addition each output is capable of 2-A peak currents
during transitions.
(1)
Rad-Tolerant: 30 kRad (Si) TID
Compatible With Voltage-Mode or
Current-Mode Control Methods
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Practical Operation at Switching Frequencies
to 1 MHz
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50-ns Propagation Delay to Output
High-Current Dual Totem Pole Outputs
(2-A Peak)
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Trimmed Oscillator Discharge Current
Low 100-µA Startup Current
Pulse-by-Pulse Current Limiting Comparator
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Latched Overcurrent Comparator With Full
Cycle Restart
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(1) Radiation tolerance is a typical value based upon initial device
qualification with dose rate = 10 mrad/sec. Radiation Lot
Acceptance Testing is available - contact factory for details.
BLOCK DIAGRAM
µ
µ
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2009, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.