UC1825A-DIE
www.ti.com
SLUSBL3 –JUNE 2013
RAD-TOLERANT, HIGH-SPEED PWM CONTROLLER
Check for Samples: UC1825A-DIE
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FEATURES
(1)
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Rad-Tolerant: 30 kRad (Si) TID
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50-ns Propagation Delay to Output
High-Current Dual Totem Pole Outputs
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Compatible With Voltage-Mode or Current-
Mode Control Methods
Trimmed Oscillator Discharge Current
Low 100-μA Startup Current
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Practical Operation at Switching Frequencies
Pulse-by-Pulse Current Limiting Comparator
(1) Radiation tolerance is a typical value based upon initial device
qualification with dose rate = 10 mrad/sec. Radiation Lot
Acceptance Testing is available - contact factory for details.
Latched Overcurrent Comparator With Full
Cycle Restart
DESCRIPTION
The UC1825A-DIE PWM controller is an improved version of the standard UC1825 family. Performance
enhancements have been made to several of the circuit blocks. Error amplifier gain bandwidth product is
12 MHz, while input offset voltage is 2 mV. Current limit threshold is assured to a tolerance of 5%. Oscillator
discharge current is specified at 10 mA for accurate dead time control. Frequency accuracy is improved to 6%.
Startup supply current, typically 100 μA, is ideal for off-line applications. The output drivers are redesigned to
actively sink current during UVLO at no expense to the startup current specification. In addition each output is
capable of 2-A peak currents during transitions.
ORDERING INFORMATION(1)
PACKAGE
DESIGNATOR
PRODUCT
PACKAGE
ORDERABLE PART NUMBER
PACKAGE QUANTITY
UC1825AVTD1
UC1825AVTD2
81
10
UC1825A
TD
Bare die in waffle pack(2)
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Processing is per the Texas Instruments space production baseline and is in compliance with the Texas Instruments Quality Control
System in effect at the time of manufacture. Electrical screening consists of DC parametric and functional testing at room temperature
only. Unless otherwise specified by Texas Instruments AC performance and performance over temperature is not warranted. Visual
Inspection is performed in accordance with MIL-STD-883 Test Method 2010 Condition B at 75X minimum.
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Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PRODUCTION DATA information is current as of publication date.
Copyright © 2013, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.