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TTD1409B PDF预览

TTD1409B

更新时间: 2024-11-21 14:56:19
品牌 Logo 应用领域
东芝 - TOSHIBA 局域网开关晶体管
页数 文件大小 规格书
6页 177K
描述
NPN Bipolar Transistor, 400 V, 6 A, TO-220SIS

TTD1409B 技术参数

是否Rohs认证: 符合生命周期:Active
包装说明:TO-220SIS, 3 PINReach Compliance Code:unknown
风险等级:5.75外壳连接:ISOLATED
最大集电极电流 (IC):6 A集电极-发射极最大电压:400 V
配置:DARLINGTON WITH BUILT-IN DIODE AND RESISTOR最小直流电流增益 (hFE):100
JEDEC-95代码:TO-220ABJESD-30 代码:R-PSFM-T3
元件数量:1端子数量:3
封装主体材料:PLASTIC/EPOXY封装形状:RECTANGULAR
封装形式:FLANGE MOUNT极性/信道类型:NPN
最大功率耗散 (Abs):25 W子类别:BIP General Purpose Small Signal
表面贴装:NO端子形式:THROUGH-HOLE
端子位置:SINGLE晶体管应用:SWITCHING
晶体管元件材料:SILICONBase Number Matches:1

TTD1409B 数据手册

 浏览型号TTD1409B的Datasheet PDF文件第2页浏览型号TTD1409B的Datasheet PDF文件第3页浏览型号TTD1409B的Datasheet PDF文件第4页浏览型号TTD1409B的Datasheet PDF文件第5页浏览型号TTD1409B的Datasheet PDF文件第6页 
TTD1409B  
Bipolar Transistors Silicon NPN Triple-Diffused Type  
TTD1409B  
1. Applications  
High-Voltage Switching  
2. Features  
(1) High DC current gain: hFE = 600 (min) (VCE = 2 V , IC = 2 A)  
(2) Monolithic construction with built-in base-emitter shunt resistor  
3. Packaging and Internal Circuit  
1. Base  
2. Collector  
3. Emitter  
TO-220SIS  
4. Absolute Maximum Ratings (Note) (Ta = 25 unless otherwise specified)  
Characteristics  
Symbol  
Rating  
Unit  
V
Collector-base voltage  
Collector-emitter voltage  
Emitter-base voltage  
Collector current (DC)  
Collector current (pulsed)  
Base current  
VCBO  
VCEO  
VEBO  
IC  
600  
400  
5
(Note 1)  
(Note 1)  
6
A
ICP  
10  
1
IB  
Collector power dissipation  
Collector power dissipation  
Junction temperature  
Storage temperature  
Mounting torque  
PC  
2
W
(Tc = 25 )  
PC  
25  
150  
Tj  
Tstg  
TOR  
-55 to 150  
0.6  
Nm  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Note 1: Ensure that the junction temperature does not exceed 150 .  
Start of commercial production  
2012-09  
©2015 Toshiba Corporation  
2015-08-06  
Rev.4.0  
1

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