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TSB82S150SS-255A PDF预览

TSB82S150SS-255A

更新时间: 2024-11-26 15:18:47
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扬杰 - YANGJIE /
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描述
TSB82S150SS-255A

TSB82S150SS-255A 数据手册

  
Q-RD02-L-86A1  
Wafer Datasheet  
TSB82S150S(A)S-255A  
(1)  
10A/150V , low VF Schottky barrier diode with trench MOS structure  
Mechanical Data  
Chip Drawing  
Item  
Die Size (A)  
Information  
2082 µm  
82 mil  
77mil  
Top Metal Pad Size (B)  
Chip Size (C)  
1950µm  
2002µm  
255 µm  
80 µm  
79mil  
Wafer Thickness (D)  
Scribe Line Width (E)  
Wafer Size  
9.5 mil  
3.15 mil  
6 inch  
AL/Ag  
Top Side Metallization  
Back Side Metallization  
Ti Ni Ag  
Stored in original container, in  
dry nitrogen, (6 months at an  
ambient temperature of  
23±3 )  
Recommended  
Storage Environment  
Electrical Characteristics (TJ=25, unless otherwise specified)(2)  
Parameter  
Description  
Min.  
Typ. Max. Unit Test Condition  
VBR  
Reverse Breakdown Voltage  
Instantaneous Forward Voltage  
Reverse Leakage Current  
155  
170  
0.8  
0.5  
-
V
V
IR =100µA  
IF =10A(3)  
VR =150V  
VF  
-
-
0.88  
10  
IR  
μA  
TJ, TSTG  
Operating and Storage Temperature  
-40to 150Max  
Note:  
(1) The preliminary wafer datasheet only for reference;  
(2) This characteristics assume the dies are assembled in SMC packages. Actual performance may degrade when assembled. YJ  
does not guarantee device performance after assembly;  
(3) Pulse Width tp = < 300μS, Duty Cycle <2%;  
扬州扬杰电子科技股份有限公司  
电话:0514-80982389  
传真:0514-80982389  
Yangzhou Yangjie Electronics Technology Co.,Ltd.  
Yangzhou Yangjie Electronics Technology Co.,Ltd.  

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