TPS40060
8
TPS40061
www.ti.com
SLUS543F –DECEMBER 2002–REVISED JUNE 2013
WIDE-INPUT SYNCHRONOUS BUCK CONTROLLER
Check for Samples: TPS40060, TPS40061
1
FEATURES
APPLICATIONS
2
•
•
•
•
Operating Input Voltage 10 V to 55 V
Input Voltage Feed-Forward Compensation
< 1% Internal 0.7-V Reference
•
•
•
•
Networking Equipment
Telecom Equipment
Base Stations
Programmable Fixed-Frequency, Up to 1-MHz
Voltage Mode Controller
Servers
DESCRIPTION
The TPS40060 and TPS40061 are high-voltage, wide
•
Internal Gate Drive Outputs for High-Side P-
Channel and Synchronous N-Channel
MOSFETs
input (10
V to 55 V) synchronous, step-down
converters.
•
•
•
•
16-Pin PowerPAD™ Package (θJC = 2°C/W)
Thermal Shutdown
This family of devices offers design flexibility with a
variety of user programmable functions, including;
soft-start, UVLO, operating frequency, voltage feed-
Externally Synchronizable
Programmable High-Side Sense Short Circuit
Protection
forward,
compensation.
synchronizable to an external supply.
high-side
current
limit,
and
are
loop
also
These
devices
•
•
Programmable Closed-Loop Soft-Start
The TPS40060 and TPS40061 incorporate MOSFET
gate drivers for external P-channel high-side and N-
channel synchronous rectifier (SR) MOSFETs. Gate
drive logic incorporates anti-cross conduction circuitry
to prevent simultaneous high-side and synchronous
rectifier conduction.
TPS40060 Source Only/TPS40061 Source/Sink
SIMPLIFIED APPLICATION DIAGRAM
TPS40060PWP
1
2
3
4
5
6
7
8
KFF
16
15
ILIM
RT
VIN
V
IN
BP5
SYNC
HDRV 14
BPN10 13
12
SGND
SS/SD
VFB
SW
+
BP10 11
LDRV 10
V
OUT
COMP
PGND
9
-
UDG-02157
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2
PowerPAD is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2002–2013, Texas Instruments Incorporated