TPS3779
TPS3780
www.ti.com
SBVS216B –SEPTEMBER 2012–REVISED MAY 2013
Low-Power, Dual-Voltage Detector in Small µSON Package
Check for Samples: TPS3779, TPS3780
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FEATURES
DESCRIPTION
The TPS3779 and TPS3780 are a family of two-
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Very Small Package: 1.45-mm × 1-mm µSON
Low Quiescent Current: 1.8 µA (typ)
channel voltage detectors with low-power and high-
accuracy comparators, and are available in a very
small µSON package. The SENSE1 and SENSE2
inputs include a built-in hysteresis for filtering to reject
brief glitches, thereby ensuring stable output
operation without false triggering. This family offers
different factory-set hysteresis options of 0.5%, 1%,
5%, or 10%.
High Threshold and Hysteresis Accuracy:
1.0%
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Adjustable Thresholds
Different Hysteresis Options:
–
0.5%, 1%, 5%, and 10%
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Temperature Range: –40°C to +125°C
The TPS3779 and TPS3780 have adjustable SENSE
inputs that can be configured by an external resistor
divider. When the voltage at the SENSE1 or SENSE2
input goes below the falling threshold, OUT1 or OUT2
is driven low, respectively. When SENSE1 or
SENSE2 rises above the rising threshold, OUT1 or
OUT2 goes high, respectively.
Push-Pull (TPS3779) and Open-Drain
(TPS3780) Output Options
APPLICATIONS
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DSPs, Microcontrollers, or Microprocessors
Applications
The devices have a very low quiescent current of
1.8 µA (typical) and provide a precise, space-
conscious solution for voltage detection suitable for
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Portable and Battery-Powered Products
Cell Phones and PDAs
low-power
system-monitoring
and
portable
Notebook and Desktop Computers
Set-Top Boxes
applications. The TPS3779 and TPS3780 operate
from 1.5 V to 6.5 V, over the –40°C to +125°C
temperature range.
IN
DRY PACKAGE
1.45-mm ´ 1-mm SON
(TOP VIEW)
VCC1
VCC
OUT1
OUT2
RST
INT
SENSE1
TPS3779
SENSE2
DSP
CPU
SENSE1
GND
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2
3
6
5
4
VCC
FPGA
V2
OUT1
OUT2
SENSE2
GND
GND
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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