TPCF8402
TOSHIBA Field Effect Transistor Silicon P, N Channel MOS Type (U-MOS IV / U-MOS III)
TPCF8402
Portable Equipment Applications
Motor Drive Applications
Unit: mm
DC-DC Converter Applications
•
•
•
•
Low drain-source ON resistance : P Channel R
N Channel R
= 60 mΩ (typ.)
= 38 mΩ (typ.)
DS (ON)
DS (ON)
High forward transfer admittance : P Channel |Y | = 5.9 S (typ.)
fs
N Channel |Y | = 6.8 S (typ.)
fs
Low leakage current : P Channel I
N Channel I
= −10 μA (V
= −30 V)
DSS
DS
= 10 μA (V
= 30 V)
DSS
DS
Enhancement-mode
: P Channel V = −0.8 to −2.0 V (V
= −10 V, I = −1mA)
D
th
DS
N Channel V = 1.3 to 2.5 V (V
= 10 V, I = 1mA)
D
th
DS
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Drain-source voltage
Symbol
Rating
Unit
V
-30
-30
30
30
V
V
V
DSS
Drain-gate voltage (R
Gate-source voltage
= 20 kΩ)
V
GS
DGR
V
±20
-3.2
-12.8
±20
4.0
16.0
GSS
JEDEC
JEITA
―
―
DC
Drain current
Pulse
(Note 1)
(Note 1)
I
D
A
I
DP
TOSHIBA
2-3U1B
Single-device operation
(Note 3a)
Drain power
dissipation
(t = 5 s)
P
P
P
P
1.35
1.12
0.53
0.33
1.35
1.12
0.53
0.33
D (1)
Weight: 0.011 g (typ.)
Single-device value at
dual operation(Note 3b)
(Note 2a)
D (2)
D (1)
D (2)
W
Circuit Configuration
Single-device operation
(Note 3a)
Drain power
dissipation
(t = 5 s)
8
7
5
6
Single-device value at
dual operation(Note 3b)
(Note 2b)
Single pulse avalanche energy(Note 4)
Avalanche current
E
0.67
-1.6
2.6
2.0
mJ
A
AS
I
AR
Repetitive avalanche energy
Single-device value at dual operation
(Note 2a, 3b, 5)
E
0.11
150
mJ
AR
Channel temperature
T
°C
°C
1
2
4
ch
3
Storage temperature range
T
−55 to 150
stg
Note: For Notes 1 to 5, refer to the next page.
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in
temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e.
operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate
reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and
Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc).
This transistor is an electrostatic-sensitive device. Handle with caution.
1
2009-12-10