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TPCF8303_07 PDF预览

TPCF8303_07

更新时间: 2024-11-26 03:26:47
品牌 Logo 应用领域
东芝 - TOSHIBA 晶体晶体管场效应晶体管
页数 文件大小 规格书
7页 230K
描述
TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (U-MOS IV)

TPCF8303_07 数据手册

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TPCF8303  
TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (U-MOS IV)  
TPCF8303  
Notebook PC Applications  
Unit: mm  
Portable Equipment Applications  
Low drain-source ON resistance: R  
= 43 m(typ.)  
DS (ON)  
High forward transfer admittance: |Y | = 6.0 S (typ.)  
fs  
Low leakage current: I  
= 10 μA (max) (V  
= 20 V)  
DSS  
DS  
Enhancement-model: V = 0.45 to 1.2 V  
th  
(V  
DS  
= 10 V, I = 200 μA)  
D
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Drain-source voltage  
Symbol  
Rating  
Unit  
V
20  
20  
±8  
V
V
V
DSS  
Drain-gate voltage (R  
Gate-source voltage  
= 20 kΩ)  
V
GS  
DGR  
V
GSS  
DC  
Pulse  
(Note 1)  
(Note 1)  
I
3.0  
12  
D
Drain current  
A
I
DP  
JEDEC  
JEITA  
Single-device operation  
(Note 3a)  
P
P
P
P
1.35  
1.12  
0.53  
0.33  
D (1)  
Drain power  
dissipation  
(t = 5 s) (Note 2a)  
Single-device value at  
dual operation (Note 3b)  
TOSHIBA  
2-3U1B  
D (2)  
D (1)  
D (2)  
W
Weight: 0.011 g (typ.)  
Single-device operation  
(Note 3a)  
Drain power  
dissipation  
(t = 5 s) (Note 2b)  
Circuit Configuration  
Single-device value at  
dual operation (Note 3b)  
8
7
5
6
Single pulse avalanche energy  
Avalanche current  
(Note 4)  
E
0.58  
mJ  
A
AS  
I
1.5  
AR  
Repetitive avalanche energy  
Single-device value at dual operation  
E
0.11  
mJ  
AR  
(Note 2a, 3b, 5)  
Channel temperature  
T
150  
°C  
°C  
ch  
Storage temperature range  
T
stg  
55~150  
1
2
4
3
Note: For (Note 1), (Note 2), (Note 3), (Note 4), (Note 5) and (Note 6),  
please refer to the next page.  
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report  
and estimated failure rate, etc).  
This transistor is an electrostatic sensitive device. Please handle with caution.  
1
2006-11-16  

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