TMS470R1A128
16/32-Bit RISC Flash Microcontrollers
www.ti.com
SPNS098–JANUARY 2005
FEATURES
• Asynchronous/Isosynchronous Modes
– Standard CAN Controller (SCC)
• 16-Mailbox Capacity
•
High-Performance Static CMOS Technology
•
TMS470R1x 16/32-Bit RISC Core
(ARM7TDMI™)
• Fully Compliant with CAN Protocol,
– 28-MHz System Clock (48-MHz Pipeline
Mode)
Version 2.0B
– Class II Serial Interface (C2SIa)
– Independent 16/32-Bit Instruction Set
– Open Architecture With Third-Party Support
– Built-In Debug Module
• Two Selectable Data Rates
• Normal Mode 10.4 Kbps and 4X Mode 41.6
Kbps
– Big-Endian Format Utilized
•
•
High-End Timer (HET)
•
Integrated Memory
– 16 Programmable I/O Channels:
• 14 High-Resolution Pins
– 128K-Byte Program Flash
• One Bank With Ten Contiguous Sectors
• 2 Standard-Resolution Pins
– High-Resolution Share Feature (XOR)
– HET RAM (64-Instruction Capacity)
• Internal State Machine for Programming
and Erase
– 8K-Byte Static RAM (SRAM)
Operating Features
10-Bit Multi-Buffered ADC (MibADC)
16-Channel
•
•
– Core Supply Voltage (VCC): 1.81 V–2.05 V
– I/O Supply Voltage (VCCIO): 3.0 V–3.6 V
– Low-Power Modes: STANDBY and HALT
– Industrial Temperature Range
470+ System Module
– 64-Word FIFO Buffer
– Single- or Continuous-Conversion Modes
– 1.55 µs Minimum Sample and Conversion
Time
– Calibration Mode and Self-Test Features
Eight External Interrupts
•
•
•
– 32-Bit Address Space Decoding
Flexible Interrupt Handling
– Bus Supervision for Memory and
Peripherals
11 Dedicated GIO Pins, 1 Input-Only GIO Pin,
and 38 Additional Peripheral I/Os
– Analog Watchdog (AWD) Timer
– Real-Time Interrupt (RTI)
•
External Clock Prescale (ECP) Module
– Programmable Low-Frequency External
Clock (CLK)
– System Integrity and Failure Detection
•
•
Zero-Pin Phase-Locked Loop (ZPLL)-Based
Clock Module With Prescaler
•
•
On-Chip Scan-Base Emulation Logic, IEEE
Standard 1149.1 (1) (JTAG) Boundary-Scan
Logic
– Multiply-by-4 or -8 Internal ZPLL Option
– ZPLL Bypass Mode
100-Pin Plastic Low-Profile Quad Flatpack (PZ
Suffix)
Six Communication Interfaces:
– Two Serial Peripheral Interfaces (SPIs)
• 255 Programmable Baud Rates
(1) The test-access port is compatible with the IEEE Standard
1149.1-1990, IEEE Standard Test-Access Port and Boundary
Scan Architecture. Boundary scan is not supported on this
device.
– Two Serial Communications Interfaces
(SCIs)
• 224 Selectable Baud Rates
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
ARM7TDMI is a trademark of Advanced RISC Machines (ARM) Limited.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2005, Texas Instruments Incorporated