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TLV3494AIPWR PDF预览

TLV3494AIPWR

更新时间: 2024-09-15 22:49:43
品牌 Logo 应用领域
BB 比较器放大器光电二极管输出元件
页数 文件大小 规格书
15页 493K
描述
1.8V, Nanopower PUSH-PULL OUTPUT COMPARATOR

TLV3494AIPWR 数据手册

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TLV3491  
TLV3492  
TLV3494  
TLV3491  
TLV3492  
®
T
L
V
3
4
9
4
TLV3494  
SBOS262C – DECEMBER 2002 – REVISED MAY 2004  
1.8V, Nanopower,  
PUSH-PULL OUTPUT COMPARATOR  
DESCRIPTION  
FEATURES  
The TLV349x family of push-pull output comparators fea-  
tures a fast 6µs response time and < 1.2µA (max) nanopower  
capability, allowing operation from 1.8V – 5.5V. Input com-  
mon-mode range beyond supply rails make the TLV349x an  
ideal choice for low-voltage applications.  
VERY LOW SUPPLY CURRENT: 0.8µA (typ)  
INPUT COMMON-MODE RANGE 200mV  
BEYOND SUPPLY RAILS  
SUPPLY VOLTAGE: +1.8V to +5.5V  
HIGH SPEED: 6µs  
Micro-sized packages provide options for portable and space-  
restricted applications. The single (TLV3491) is available  
in SOT23-5 and SO-8. The dual (TLV3492) comes in  
SOT23-8 and SO-8. The quad (TLV3494) is available in  
TSSOP-14 and SO-14.  
PUSH-PULL CMOS OUTPUT STAGE  
SMALL PACKAGES:  
SOT23-5 (Single)  
SOT23-8 (Dual)  
The TLV349x is excellent for power-sensitive, low-voltage  
(2-cell) applications.  
APPLICATIONS  
PORTABLE MEDICAL EQUIPMENT  
WIRELESS SECURITY SYSTEMS  
REMOTE CONTROL SYSTEMS  
HANDHELD INSTRUMENTS  
TLV349x RELATED PRODUCTS  
PRODUCT  
FEATURES  
TLV370x  
560nA, 2.5V to 16V, Push-Pull CMOS Output Stage  
Comparator  
TLV340x  
550nA, 2.5V to 16V, Open Drain Output Stage Comparator  
ULTRA-LOW POWER SYSTEMS  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
All trademarks are the property of their respective owners.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
Copyright © 2002-2004, Texas Instruments Incorporated  
www.ti.com  

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