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TLC2202CDRG4 PDF预览

TLC2202CDRG4

更新时间: 2024-09-16 04:49:11
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描述
Advanced LinCMOSE LOW-NOISE PRECISION OPERATIONAL AMPLIFIERS

TLC2202CDRG4 数据手册

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TLC220x, TLC220xA, TLC220xB, TLC220xY  
Advanced LinCMOS LOW-NOISE PRECISION  
OPERATIONAL AMPLIFIERS  
SLOS175 – FEBRUARY 1997  
B Grade Is 100% Tested for Noise  
30 nV/Hz Max at f = 10 Hz  
12 nV/Hz Max at f = 1 kHz  
Low Input Bias Current  
1 pA Typ at T = 25°C  
A
Common-Mode Input Voltage Range  
Includes the Negative Rail  
Low Input Offset Voltage . . . 500 µV Max  
Excellent Offset Voltage Stability  
With Temperature . . . 0.5 µV/°C Typ  
Fully Specified For Both Single-Supply and  
Split-Supply Operation  
Rail-to-Rail Output Swing  
TYPICAL EQUIVALENT  
INPUT NOISE VOLTAGE  
vs  
description  
FREQUENCY  
The TLC220x, TLC220xA, TLC220xB, and  
TLC220xY are precision, low-noise operational  
amplifiers using Texas Instruments Advanced  
LinCMOS process. These devices combine the  
noise performance of the lowest-noise JFET  
amplifiers with the dc precision available  
previously only in bipolar amplifiers. The  
Advanced LinCMOS process uses silicon-gate  
technology to obtain input offset voltage stability  
with temperature and time that far exceeds that  
obtainable using metal-gate technology. In  
addition, this technology makes possible input  
impedance levels that meet or exceed levels  
offered by top-gate JFET and expensive  
dielectric-isolated devices.  
60  
V
= 5 V  
= 20  
= 25°C  
DD  
S
R
T
50  
40  
30  
20  
10  
0
A
The combination of excellent dc and noise  
performance with a common-mode input voltage  
range that includes the negative rail makes these  
devices an ideal choice for high-impedance,  
low-level signal-conditioning applications in either  
single-supply or split-supply configurations.  
1
10  
100  
1 k  
10 k  
f – Frequency – Hz  
The device inputs and outputs are designed to withstand –100-mA surge currents without sustaining latch-up.  
In addition, internal ESD-protection circuits prevent functional failures at voltages up to 2000 V as tested under  
MIL-PRF-38535, Method 3015.2; however, care should be exercised in handling these devices as exposure  
to ESD may result in degradation of the parametric performance.  
The C-suffix devices are characterized for operation from 0°C to 70°C. The I-suffix devices are characterized  
for operation from 40°C to 85°C. The M-suffix devices are characterized for operation over the full military  
temperature range of 55°C to 125°C.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Advanced LinCMOS is a trademark of Texas Instruments Incorporated.  
Copyright 1997, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
On products compliant to MIL-PRF-38535, all parameters are tested  
unless otherwise noted. On all other products, production  
processing does not necessarily include testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  

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