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TL4051CQDBZRG4 PDF预览

TL4051CQDBZRG4

更新时间： 2024-11-05 07:04:35
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德州仪器 - TI 电源电路参考电压源光电二极管输出元件
页数 文件大小 规格书
25页 607K
描述
PRECISION MICROPOWER SHUNT VOLTAGE REFERENCE

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TL4051CQDBZRG4 技术参数

是否无铅：不含铅是否Rohs认证：符合
生命周期：Obsolete零件包装代码：SOT-23
包装说明：GREEN, PLASTIC, SOT-23, 3 PIN针数：3
Reach Compliance Code：compliantECCN代码：EAR99
HTS代码：8542.39.00.01风险等级：5.7
Is Samacsys：N其他特性：OUTPUT VOLTAGE ADJUSTABLE FROM 1.225V TO 10V
模拟集成电路 - 其他类型：TWO TERMINAL VOLTAGE REFERENCEJESD-30 代码：R-PDSO-G3
JESD-609代码：e4长度：2.92 mm
湿度敏感等级：1功能数量：1
输出次数：1端子数量：3
最高工作温度：125 °C最低工作温度：-40 °C
最大输出电压：1.218 V最小输出电压：1.206 V
标称输出电压：1.212 V封装主体材料：PLASTIC/EPOXY
封装代码：TSSOP封装等效代码：TO-236
封装形状：RECTANGULAR封装形式：SMALL OUTLINE, THIN PROFILE, SHRINK PITCH
峰值回流温度（摄氏度）：260认证状态：Not Qualified
座面最大高度：1.12 mm子类别：Voltage References
表面贴装：YES技术：BIPOLAR
最大电压温度系数：50 ppm/ °C温度等级：AUTOMOTIVE
端子面层：Nickel/Palladium/Gold (Ni/Pd/Au)端子形式：GULL WING
端子节距：0.95 mm端子位置：DUAL
处于峰值回流温度下的最长时间：NOT SPECIFIED微调/可调输出：YES
最大电压容差：0.5%宽度：1.3 mm
Base Number Matches：1

TL4051CQDBZRG4 数据手册

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TL4051  
PRECISION MICROPOWER SHUNT VOLTAGE REFERENCE  
www.ti.com  
SLOS487–JUNE 2007  
FEATURES  
APPLICATIONS  
•
•
•
•
•
•
•
•
Data-Acquisition Systems  
Power Supplies and Power-Supply Monitors  
Instrumentation and Test Equipment  
Process Control  
Precision Audio  
Automotive Electronics  
•
1.225-V Fixed and Adjustable (1.225-V to 10-V)  
Outputs  
•
Tight Output Tolerances and Low  
Temperature Coefficient  
–
–
–
Max 0.1%, 50 ppm/°C – A Grade  
Max 0.2%, 50 ppm/°C – B Grade  
Max 0.5%, 50 ppm/°C – C Grade  
Energy Management/Metering  
Battery-Powered Equipment  
•
•
Low Output Noise…20 µVRMS (Typ)  
Wide Operating Current Range…  
60 µA (Typ) to 12 mA  
•
•
Stable With All Capacitive Loads; No Output  
Capacitor Required  
Available in  
–
–
Industrial Temperature: –40°C to 85°C  
Extended Temperature: –40°C to 125°C  
1.2 V...DBZ (SOT-23-3) PACKAGE  
(TOP VIEW)  
1.2 V...DCK (SC-70) PACKAGE  
(TOP VIEW)  
1
1
5
ANODE  
*
NC  
CATHODE  
*
3
2
3
2
ANODE  
4
CATHODE  
NC  
NC – No internal connection  
* Pin 3 is attached to Substrate and must  
be connected to ANODE or left open.  
* Pin 2 is attached to Substrate and must  
be connected to ANODE or left open.  
Adjustable...DBZ (SOT-23-3) PACKAGE  
(TOP VIEW)  
Adjustable...DCK (SC-70) PACKAGE  
(TOP VIEW)  
5
1
FB  
1
2
NC  
ANODE  
FB  
3
ANODE  
2
3
CATHODE  
4
CATHODE  
NC  
NC – No internal connection  
DESCRIPTION/ORDERING INFORMATION  
The TL4051 series of shunt voltage references are versatile easy-to-use references suitable for a wide array of  
applications. The device is available in a fixed 1.225-V output or an adjustable output whose voltage is  
determined by an external resistor divider. The device requires no external capacitors for operation and is stable  
with all capacitive loads. Additionally, the reference offers low dynamic impedance, low noise, and low  
temperature coefficient to ensure a stable output voltage over a wide range of operating currents and  
temperatures.  
The TL4051 is offered in three initial tolerances, ranging from 0.1% (max) for the A grade to 0.5% (max) for the  
C grade. Thus, a great deal of flexibility is offered to designers in choosing the best cost-to-performance ratio for  
their applications. Packaged in the space-saving SOT-23-3 and SC-70 packages and requiring a minimum  
current of 45 µA (typ), the TL4051 also is ideal for portable applications.  
The TL4051xI is characterized for operation over an ambient temperature range of –40°C to 85°C. The  
TL4051xQ is characterized for operation over an ambient temperature range of –40°C to 125°C.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2007, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
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