TL3016, TL3016Y
ULTRA-FAST LOW-POWER
PRECISION COMPARATORS
SLCS130D – MARCH 1997 – REVISED MARCH 2000
D AND PW PACKAGE
(TOP VIEW)
Ultrafast Operation . . . 7.6 ns (Typ)
Low Positive Supply Current
10.6 mA (Typ)
V
V
Q OUT
1
2
3
4
8
7
6
5
CC+
IN+
Operates From a Single 5-V Supply or From
a Split ±5-V Supply
Q OUT
IN–
GND
LATCH ENABLE
Complementary Outputs
CC–
Low Offset Voltage
No Minimum Slew Rate Requirement
Output Latch Capability
symbol (each comparator)
Functional Replacement to the LT1016
IN+
IN–
description
Q OUT
Q OUT
The TL3016 is an ultrafast comparator designed
to interface directly to TTL logic while operating
from either a single 5-V power supply or dual
±5-V supplies. It features extremely tight offset
voltage and high gain for precision applications. It
has complementary outputs that can be latched
using the LATCH ENABLE terminal. Figure 1
shows the positive supply current of this
comparator. The TL3016 only requires 10.6 mA
(typical) to achieve a propagation delay of 7.6 ns.
POSITIVE SUPPLY CURRENT
vs
FREE-AIR TEMPERATURE
15
14
V
CC
= ± 5 V
13
12
The TL3016 is a pin-for-pin functional replace-
ment for the LT1016 comparator, offering higher
speed operation but consuming half the power.
11
AVAILABLE OPTIONS
10
9
PACKAGED DEVICES
CHIP
SMALL
OUTLINE
(D)
‡
T
A
FORM
(Y)
TSSOP
(PW)
†
8
0°C to 70°C
TL3016CD
TL3016ID
TL3016CPWLE
TL3016IPWLE
TL3016Y
—
7
–40°C to 85°C
6
5
†
‡
The PW packages are available left-ended taped and reeled only.
Chip forms are tested at T = 25°C only.
A
– 50 – 25
0
25
50
75
100
125
T
A
– Free-Air Temperature – °C
Figure 1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright 2000, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
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