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TL1591PS PDF预览

TL1591PS

更新时间: 2024-02-14 18:04:18
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德州仪器 - TI /
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TL1591PS 数据手册

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TL1591  
SAMPLE-AND-HOLD CIRCUIT FOR CCD IMAGERS  
SOCS026B – SEPTEMBER 1989 – REVISED JUNE 1994  
P OR PS PACKAGE  
(TOP VIEW)  
15-MHz Sampling Rate  
30-ns Acquisition Time  
Diode-Bridge Switch  
25-MHz Bandwidth  
ANLG V  
DGTL V  
CC  
1
2
3
4
8
7
6
5
CC  
ANLG IN  
ANLG GND  
ANLG OUT  
DGTL IN  
DGTL GND  
SUB GND  
Low-Voltage Supply  
description  
The TL1591 is a monolithic integrated sample-and-hold circuit that uses the BiFET process with  
Schottky-barrier diodes and is designed for use with CCD area imagers. This device consists of an ultra-fast  
input-bufferamplifier, adigital-controlleddiode-bridgeswitch, andahigh-impedanceoutputbufferamplifier. The  
electronic switch is controlled by an LS-TTL-compatible logic input.  
functional block diagram  
4
ANLG OUT  
2
A1  
A2  
A3  
ANLG IN  
7
DGTL IN  
C1  
This device contains circuits to protect its inputs and outputs against damage due to high static voltages or electrostatic fields. These  
circuits have been qualified to protect this device against electrostatic discharges (ESD) of up to 2 kV according to MIL-STD-883C,  
Method3015;however, precautionsshouldbetakentoavoidapplicationofanyvoltagehigherthanmaximum-ratedvoltagestothese  
high-impedance circuits. During storage or handling, the device leads should be shorted together or the device should be placed in  
conductive foam. In a circuit, unused inputs should always be connected to an appropriate logic voltage level, preferably either V  
Specific guidelines for handling devices of this type are contained in the publication Guidelines for Handling Electrostatic-Discharge-Sensitive  
(ESDS) Devices and Assemblies available from Texas Instruments.  
or ground.  
CC  
Copyright 1994, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  

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