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TK3R3E03GL

更新时间: 2024-11-30 14:58:19
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
9页 432K
描述
EOL announced

TK3R3E03GL 数据手册

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TK3R3E03GL  
MOSFETs Silicon N-Channel MOS (U-MOS-H)  
TK3R3E03GL  
1. Applications  
Switching Voltage Regulators  
2. Features  
(1) Low drain-source on-resistance: RDS(ON) = 2.6 m(typ.) (VGS = 10 V)  
(2) Low leakage current: IDSS = 10 µA (max) (VDS = 30 V)  
(3) Enhancement mode: Vth = 1.3 to 2.3 V (VDS = 10 V, ID =0.5 mA)  
3. Packaging and Internal Circuit  
1: Gate  
2: Drain (heatsink)  
3: Source  
TO-220  
4. Absolute Maximum Ratings (Note) (Ta = 25 unless otherwise specified)  
Characteristics  
Symbol  
Rating  
Unit  
Drain-source voltage  
Gate-source voltage  
Drain current (DC)  
Drain current (DC)  
Drain current (pulsed)  
Power dissipation  
VDSS  
VGSS  
ID  
30  
±20  
V
V
(Silicon Limit)  
(Note 1), (Note 2)  
(Note 1)  
147  
A
ID  
80  
A
(t = 100 µs)  
(Tc = 25 )  
(Note 1)  
IDP  
360  
A
PD  
104  
W
mJ  
A
Single-pulse avalanche energy  
Single-pulse avalanche current  
Channel temperature  
(Note 3)  
(Note 3)  
EAS  
IAS  
50  
80  
Tch  
Tstg  
150  
Storage temperature  
-55 to 150  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Start of commercial production  
2015-12  
©2015 Toshiba Corporation  
2015-12-11  
Rev.1.0  
1

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