Datasheet > TK31V60W5

TK31V60W5

更新时间： 2024-11-28 14:58:19

品牌	Logo	应用领域
东芝 - TOSHIBA		/
页数	文件大小	规格书
10页	279K
描述
N-ch MOSFET, 600 V, 0.109 Ω@10V, DFN 8 x 8, DTMOSⅣ

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TK31V60W5 数据手册

TK31V60W5

MOSFETs Silicon N-Channel MOS (DTMOS)

TK31V60W5

1. Applications

•

Switching Voltage Regulators

2. Features

(1) Fast reverse recovery time: trr = 135 ns (typ.)

(2) Low drain-source on-resistance: RDS(ON) = 0.087 Ω(typ.)

(3) Easy to control Gate switching

(4) Enhancement mode: Vth = 3 to 4.5 V (VDS = 10 V, ID = 1.5 mA)

3. Packaging and Internal Circuit

1: Gate

2: Source1

3,4: Source2

5: Drain (Heatsink)

Notice:

Please use the source1 pin for

gate input signal return. Make

sure that the main current flows

into the source2 pins.

DFN8x8

4. Absolute Maximum Ratings (Note) (Ta = 25  unless otherwise specified)

Characteristics

Symbol

Rating

Unit

Drain-source voltage

Gate-source voltage

Drain current (DC)

Drain current (pulsed)

Power dissipation

VDSS

VGSS

600

±30

(Note 1)

30.8

123

IDP

(Tc = 25 )

240

Single-pulse avalanche energy

Avalanche current

(Note 2)

EAS

IAR

338

7.7

Reverse drain current (DC)

Reverse drain current (pulsed)

Channel temperature

(Note 1)

IDR

30.8

123

IDRP

Tch

150



Storage temperature

Tstg

-55 to 150

Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the

significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even

if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum

ratings.

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook

("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test

report and estimated failure rate, etc).

Start of commercial production

2014-07

2016-08-30

Rev.5.0

12 3 4 5 6 7...10

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