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TK100E06N1 PDF预览

TK100E06N1

更新时间: 2024-11-21 14:56:47
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
9页 244K
描述
N-ch MOSFET, 60 V, 0.0023 Ω@10V, TO-220, U-MOSⅧ-H

TK100E06N1 技术参数

生命周期:Active包装说明:FLANGE MOUNT, R-PSFM-T3
Reach Compliance Code:unknown风险等级:5.71
Samacsys Description:Toshiba TK100E06N1 N-channel MOSFET Transistor, 263 A, 60 V, 3-Pin TO-220雪崩能效等级(Eas):413 mJ
外壳连接:DRAIN配置:SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压:60 V最大漏极电流 (Abs) (ID):100 A
最大漏极电流 (ID):100 A最大漏源导通电阻:0.0023 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJEDEC-95代码:TO-220AB
JESD-30 代码:R-PSFM-T3元件数量:1
端子数量:3工作模式:ENHANCEMENT MODE
最高工作温度:150 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:FLANGE MOUNT
极性/信道类型:N-CHANNEL最大功率耗散 (Abs):255 W
最大脉冲漏极电流 (IDM):627 A子类别:FET General Purpose Power
表面贴装:NO端子形式:THROUGH-HOLE
端子位置:SINGLE晶体管应用:SWITCHING
晶体管元件材料:SILICONBase Number Matches:1

TK100E06N1 数据手册

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TK100E06N1  
MOSFETs Silicon N-channel MOS (U-MOS-H)  
TK100E06N1  
1. Applications  
Switching Voltage Regulators  
2. Features  
(1) Low drain-source on-resistance: RDS(ON) = 1.9 m(typ.) (VGS = 10 V)  
(2) Low leakage current: IDSS = 10 µA (max) (VDS = 60 V)  
(3) Enhancement mode: Vth = 2.0 to 4.0 V (VDS = 10 V, ID = 1.0 mA)  
3. Packaging and Internal Circuit  
1: Gate  
2: Drain (heatsink)  
3: Source  
TO-220  
4. Absolute Maximum Ratings (Note) (Ta = 25unless otherwise specified)  
Characteristics  
Symbol  
Rating  
Unit  
V
Drain-source voltage  
Gate-source voltage  
Drain current (DC)  
Drain current (DC)  
Drain current (pulsed)  
Power dissipation  
VDSS  
VGSS  
ID  
60  
±20  
(Silicon limit)  
(Note 1), (Note 2)  
(Note 1), (Note 3)  
(Note 1)  
263  
A
ID  
100  
(t = 1 ms)  
IDP  
627  
(Tc = 25)  
PD  
255  
W
mJ  
A
Single-pulse avalanche energy  
Avalanche current  
(Note 4)  
EAS  
IAR  
413  
100  
Channel temperature  
Storage temperature  
Tch  
Tstg  
150  
-55 to 150  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Start of commercial production  
2012-04  
2014-06-30  
Rev.4.0  
1

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