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TK100A08N1 PDF预览

TK100A08N1

更新时间: 2024-09-17 14:56:55
品牌 Logo 应用领域
东芝 - TOSHIBA /
页数 文件大小 规格书
9页 233K
描述
N-ch MOSFET, 80 V, 0.0032 Ω@10V, TO-220SIS, U-MOSⅧ-H

TK100A08N1 数据手册

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TK100A08N1  
MOSFETs Silicon N-channel MOS (U-MOS-H)  
TK100A08N1  
1. Applications  
Switching Voltage Regulators  
2. Features  
(1) Low drain-source on-resistance: RDS(ON) = 2.6 m(typ.) (VGS = 10 V)  
(2) Low leakage current: IDSS = 10 µA (max) (VDS = 80 V)  
(3) Enhancement mode: Vth = 2.0 to 4.0 V (VDS = 10 V, ID = 1.0 mA)  
3. Packaging and Internal Circuit  
1: Gate  
2: Drain  
3: Source  
TO-220SIS  
4. Absolute Maximum Ratings (Note) (Ta = 25unless otherwise specified)  
Characteristics  
Symbol  
Rating  
Unit  
V
Drain-source voltage  
Gate-source voltage  
Drain current (DC)  
Drain current (DC)  
Drain current (pulsed)  
Power dissipation  
VDSS  
VGSS  
ID  
80  
±20  
(Silicon limit)  
(Tc = 25)  
(t = 1 ms)  
(Note 1,2)  
(Note 1)  
(Note 1)  
214  
A
ID  
100  
IDP  
568  
(Tc = 25)  
PD  
45  
W
mJ  
A
Single-pulse avalanche energy  
Avalanche current  
(Note 3)  
EAS  
IAR  
278  
100  
Channel temperature  
Storage temperature  
Tch  
Tstg  
150  
-55 to 150  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
("Handling Precautions"/"Derating Concept and Methods") and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
Start of commercial production  
2011-12  
2014-01-28  
Rev.3.0  
1

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