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TIBPAL22V10C_15 PDF预览

TIBPAL22V10C_15

更新时间: 2024-11-04 02:58:43
品牌 Logo 应用领域
德州仪器 - TI /
页数 文件大小 规格书
22页 564K
描述
HIGH-PERFORMANCE IMPACT

TIBPAL22V10C_15 数据手册

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TIBPAL22V10AM is Not Recommended For New Designs  
TIBPAL22V10C, TIBPAL22V10AC, TIBPAL22V10AM  
HIGH-PERFORMANCE IMPACTꢀPROGRAMMABLE ARRAY LOGIC CIRCUITS  
SRPS024A − OCTOBER 1986 − REVISED APRIL 2010  
C SUFFIX . . . NT PACKAGE  
M SUFFIX . . . JT OR W PACKAGE  
Second-Generation PLD Architecture  
(TOP VIEW)  
Choice of Operating Speeds  
TIBPAL22V10AC . . . 25 ns Max  
TIBPAL22V10AM . . . 30 ns Max  
TIBPAL22V10C . . . 35 ns Max  
CLK/I  
VCC  
1
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
14  
13  
I
I
I
I
I
I
I
I
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I
2
3
Increased Logic Power − Up to 22 Inputs  
4
and 10 Outputs  
5
6
Increased Product Terms − Average of 12  
7
Per Output  
8
Variable Product Term Distribution  
Allows More Complex Functions to Be  
Implemented  
9
I
I
10  
11  
12  
GND  
Each Output Is User Programmable for  
Registered or Combinational Operation,  
Polarity, and Output Enable Control  
C SUFFIX . . . FN PACKAGE  
M SUFFIX . . . FK PACKAGE  
TTL-Level Preload for Improved Testability  
(TOP VIEW)  
Extra Terms Provide Logical Synchronous  
Set and Asynchronous Reset Capability  
Fast Programming, High Programming  
Yield, and Unsurpassed Reliability Ensured  
Using Ti-W Fuses  
4
3
2
1
28 27 26  
25  
5
6
7
8
9
I
I
I
I/O/Q  
I/O/Q  
I/O/Q  
24  
23  
AC and DC Testing Done at the Factory  
NC  
22 NC  
Utilizing Special Designed-In Test Features  
I
I
I
21 I/O/Q  
20 I/O/Q  
19 I/O/Q  
10  
11  
Dependable Texas Instruments Quality and  
Reliability  
12 13 14 15 16 17 18  
Package Options Include Both Plastic and  
Ceramic Chip Carriers in Addition to Plastic  
and Ceramic DIPs  
NC No internal connection  
Pin assignments in operating mode  
Functionally Equivalent to AMDs  
AMPAL22V10 and AMPAL22V10A  
description  
The TIBPAL22V10 and TIBPAL22V10A are programmable array logic devices featuring high speed and  
functional equivalency when compared to presently available devices. They are implemented with the familiar  
sum-of-products (AND-OR) logic structure featuring the new concept “Programmable Output Logic Macrocell”.  
These IMPACTcircuits combine the latest Advanced Low-Power Schottky technology with proven  
titanium-tungsten fuses to provide reliable, high-performance substitutes for conventional TTL logic.  
These devices contain up to 22 inputs and 10 outputs. They incorporate the unique capability of defining and  
programming the architecture of each output on an individual basis. Outputs may be registered or nonregistered  
and inverting or noninverting as shown in the output logic macrocell diagram. The ten potential outputs are  
enabled through the use of individual product terms.  
These devices are covered by U.S. Patent 4,410,987.  
IMPACT is a trademark of Texas Instruments Incorporated.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2010, Texas Instruments Incorporated  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
1

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