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TIBPAL22V10-20M PDF预览

TIBPAL22V10-20M

更新时间： 2024-11-02 23:03:39
品牌 Logo 应用领域
德州仪器 - TI /
页数 文件大小 规格书
17页 164K
描述
HIGH-PERFORMANCE IMPACT-X E PROGRAMMABLE ARRAY LOGIC CIRCUITS

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TIBPAL22V10-20M 数据手册

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TIBPAL22V10-20M  
HIGH-PERFORMANCE IMPACT-X PROGRAMMABLE ARRAY LOGIC CIRCUITS  
SRPS012A – D3523, JUNE 1990 – REVISED MARCH 1992  
JT PACKAGE  
(TOP VIEW)  
•
•
Second-Generation PLD Architecture  
High-Performance Operation:  
CLK/I  
V
CC  
1
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
14  
13  
f
(External Feedback) . . . 33.3 MHz  
max  
I
I
I
I
I
I
I
I
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I/O/Q  
I
2
Propagation Delay . . . 20 ns Max  
3
•
•
•
Increased Logic Power – Up to 22 Inputs  
and 10 Outputs  
4
5
6
Increased Product Terms – Average of 12  
per Output  
7
8
Variable Product Term Distribution  
Allows More Complex Functions to Be  
Implemented  
9
I
I
10  
11  
12  
GND  
•
Each Output Is User Programmable for  
Registered or Combinational Operation,  
Polarity, and Output Enable Control  
FK PACKAGE  
(TOP VIEW)  
•
•
•
Power-Up Clear on Registered Outputs  
TTL-Level Preload for Improved Testability  
Extra Terms Provide Logical Synchronous  
Set and Asynchronous Reset Capability  
4
5
3 2 1 28 27 26  
I
I
I
I/O/Q  
I/O/Q  
I/O/Q  
25  
24  
23  
6
•
Fast Programming, High Programming  
Yield, and Unsurpassed Reliability Ensured  
Using Ti-W Fuses  
7
8
NC  
22 NC  
9
I
I
I
21 I/O/Q  
20 I/O/Q  
19 I/O/Q  
•
•
•
AC and DC Testing Done at the Factory  
Utilizing Special Designed-In Test Features  
10  
11  
12 13 14 15 16 17 18  
Dependable Texas Instruments Quality and  
Reliability  
Package Options Include Plastic  
Dual-In-Line and Chip Carrier Packages  
NC – No internal connection  
Pin assignments in operating mode  
description  
The TIBPAL22V10-20M is a programmable array logic device featuring high speed and functional equivalency  
when compared to presently available devices. They are implemented with the familiar sum-of-products  
(AND-OR) logic structure featuring the new concept “Programmable Output Logic Macrocell”. These  
IMPACT-X circuits combine the latest Advanced Low-Power Schottky technology with proven titanium-  
tungsten fuses to provide reliable, high-performance substitutes for conventional TTL logic.  
These devices contain up to 22 inputs and 10 outputs. They incorporate the unique capability of defining and  
programming the architecture of each output on an individual basis. Outputs may be registered or nonregistered  
and inverting or noninverting as shown in the output logic macrocell diagram. The ten potential outputs are  
enabled through the use of individual product terms.  
Further advantages can be seen in the introduction of variable product term distribution. This technique  
allocates from 8 to 16 logical product terms to each output for an average of 12 product terms per output. This  
variable allocation of terms allows far more complex functions to be implemented than in previously available  
devices.  
This device is covered by U.S. Patent 4,410,987.  
IMPACT-X is a trademark of Texas Instruments Incorporated.  
PRODUCTION DATA information is current as of publication date.  
Copyright 1992, Texas Instruments Incorporated  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1
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