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TIBPAL20R4-10CFN PDF预览

TIBPAL20R4-10CFN

更新时间： 2024-11-02 22:08:11
品牌 Logo 应用领域
德州仪器 - TI /
页数 文件大小 规格书
24页 288K
描述
HIGH-PERFORMANCE IMPACT-X PAL CIRCUITS

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TIBPAL20R4-10CFN 技术参数

是否无铅： 含铅是否Rohs认证： 不符合
生命周期：Obsolete零件包装代码：QFN
包装说明：QCCJ, LDCC28,.5SQ针数：28
Reach Compliance Code：not_compliantHTS代码：8542.39.00.01
Factory Lead Time：1 week风险等级：5.84
其他特性：REGISTER PRELOAD; POWER-UP RESET架构：PAL-TYPE
最大时钟频率：55.5 MHzJESD-30 代码：S-PQCC-J28
长度：11.5062 mm专用输入次数：12
I/O 线路数量：4输入次数：16
输出次数：8产品条款数：64
端子数量：28最高工作温度：75 °C
最低工作温度：组织：12 DEDICATED INPUTS, 4 I/O
输出函数：MIXED封装主体材料：PLASTIC/EPOXY
封装代码：QCCJ封装等效代码：LDCC28,.5SQ
封装形状：SQUARE封装形式：CHIP CARRIER
峰值回流温度（摄氏度）：NOT SPECIFIED电源：5 V
可编程逻辑类型：OT PLD传播延迟：10 ns
认证状态：Not Qualified座面最大高度：4.57 mm
子类别：Programmable Logic Devices最大供电电压：5.25 V
最小供电电压：4.75 V标称供电电压：5 V
表面贴装：YES技术：TTL
温度等级：COMMERCIAL EXTENDED端子形式：J BEND
端子节距：1.27 mm端子位置：QUAD
处于峰值回流温度下的最长时间：NOT SPECIFIED宽度：11.5062 mm
Base Number Matches：1

TIBPAL20R4-10CFN 数据手册

 浏览型号TIBPAL20R4-10CFN的Datasheet PDF文件第2页浏览型号TIBPAL20R4-10CFN的Datasheet PDF文件第3页浏览型号TIBPAL20R4-10CFN的Datasheet PDF文件第4页浏览型号TIBPAL20R4-10CFN的Datasheet PDF文件第5页浏览型号TIBPAL20R4-10CFN的Datasheet PDF文件第6页浏览型号TIBPAL20R4-10CFN的Datasheet PDF文件第7页 
TIBPAL20L8-10C, TIBPAL20R4-10C, TIBPAL20R6-10C, TIBPAL20R8-10C  
HIGH-PERFORMANCE IMPACT-X PAL CIRCUITS  
SRPS008A – D3336, OCTOBER 1989 – REVISED MARCH 1992  
TIBPAL20L8’  
JT OR NT PACKAGE  
•
High-Performance Operation:  
f
f
f
(no feedback)  
TIBPAL20R’ . . . 71.4 MHz  
(internal feedback)  
TIBPAL20R’ . . . 58.8 MHz  
(external feedback)  
TIBPAL20R’ . . . 55.5 MHz  
max  
(TOP VIEW)  
max  
I
I
I
I
I
I
I
I
V
I
O
I/O  
I/O  
I/O  
I/O  
I/O  
I/O  
O
1
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
14  
13  
CC  
2
max  
3
4
Propagation Delay  
5
TIBPAL20’ . . . 10 ns Max  
6
•
•
•
Functionally Equivalent, but Faster Than  
Existing 24-Pin PLD Circuits  
7
8
I
I
I
9
Preload Capability on Output Registers  
Simplifies Testing  
10  
11  
12  
I
I
GND  
Power-Up Clear on Registered Devices (All  
Register Outputs are Set Low, but Voltage  
Levels at the Output Pins Go High)  
TIBPAL20L8’  
FN PACKAGE  
•
Package Options Include Plastic Chip  
Carriers in Addition to Plastic and Ceramic  
DIPs  
(TOP VIEW)  
•
•
Security Fuse Prevents Duplication  
4
5
3
2
1
28 27 26  
25  
Dependable Texas Instruments Quality and  
Reliability  
I
I
I
I/O  
I/O  
I/O  
6
24  
23  
7
I/O  
PORT  
S
I
3-STATE  
REGISTERED  
Q OUTPUTS  
DEVICE  
8
NC  
22 NC  
21 I/O  
20 I/O  
19 I/O  
INPUTS O OUTPUTS  
9
I
I
I
PAL20L8  
PAL20R4  
PAL20R6  
PAL20R8  
14  
12  
12  
12  
2
0
0
0
0
6
4
2
0
10  
11  
4 (3-state buffers)  
6 (3-state buffers)  
8 (3-state buffers)  
12 13 14 15 16 17 18  
description  
These programmable array logic devices feature  
high speed and functional equivalency when  
compared with currently available devices. These  
IMPACT-X circuits combine the latest Advanced  
NC – No internal connection  
Pin assignments in operating mode  
Low-Power Schottky technology with proven titanium-tungsten fuses to provide reliable, high-performance  
substitutes for conventional TTL logic. Their easy programmability allows for quick design of custom functions  
and typically results in a more compact circuit board. In addition, chip carriers are available for futher reduction  
in board space.  
Alloftheregisteroutputsaresettoalowlevelduringpowerup. Extracircuitryhasbeenprovidedtoallowloading  
of each register asynchronously to either a high or low state. This feature simplifies testing because the registers  
can be set to an initial state prior to executing the test sequence.  
The TIBPAL20’ C series is characterized from 0°C to 75°C.  
These devices are covered by U.S. Patent 4,410,987.  
IMPACT-X is a trademark of Texas Instruments Incorporated.  
PAL is a registered trademark of Advanced Micro Devices Inc.  
PRODUCTION DATA information is current as of publication date.  
Copyright 1992, Texas Instruments Incorporated  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily  
include testing of all parameters.  
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1
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