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SCBS755B − APRIL 2002 − REVISED MARCH 2004
SN54LVT8980A . . . JT PACKAGE
SN74LVT8980A . . . DW PACKAGE
(TOP VIEW)
D
Members of Texas Instruments Broad
Family of Testability Products Supporting
IEEE Std 1149.1-1990 (JTAG) Test Access
Port (TAP) and Boundary-Scan Architecture
24
23
22
21
20
19
18
17
16
15
14
13
1
STRB
R/W
D0
D1
D2
D3
GND
D4
A0
A1
A2
RDY
TDO
D
D
D
Provide Built-In Access to IEEE Std 1149.1
Scan-Accessible Test/Maintenance
Facilities at Board and System Levels
2
3
4
5
While Powered at 3.3 V, the TAP Interface Is
Fully 5-V Tolerant for Mastering Both 5-V
and/or 3.3-V IEEE Std 1149.1 Targets
6
V
CC
7
TCK
TMS
TRST
TDI
RST
TOE
8
Simple Interface to Low-Cost 3.3-V
Microprocessors/Microcontrollers Via 8-Bit
Asynchronous Read/Write Data Bus
9
D5
D6
D7
10
11
12
D
D
Easy Programming Via Scan-Level
Command Set and Smart TAP Control
CLKIN
Transparently Generate Protocols to
Support Multidrop TAP Configurations
Using TI’s Addressable Scan Port
SN54LVT8980A . . . FK PACKAGE
(TOP VIEW)
D
D
Flexible TCK Generator Provides
Programmable Division, Gated-TCK, and
Free-Running-TCK Modes
4
3
2
1 28 27 26
25
D1
RDY
TDO
Discrete TAP Control Mode Supports
Arbitrary TMS/TDI Sequences for
Noncompliant Targets
5
D2
D3
NC
6
24
23
22
21
20
19
V
7
CC
NC
8
D
D
D
D
Programmable 32-Bit Test Cycle Counter
Allows Virtually Unlimited Scan/Test Length
GND
D4
TCK
TMS
TRST
9
10
11
Accommodate Target Retiming (Pipeline)
Delays of up to 15 TCK Cycles
D5
12 13 14 15 16 17 18
Test Output Enable (TOE) Allows for
External Control of TAP Signals
High-Drive Outputs (−32-mA I , 64-mA I
)
OH
OL
NC − No internal connection
at TAP Support Backplane Interface and/or
High Fanout
description
The ’LVT8980A embedded test-bus controllers (eTBCs) are members of the TI broad family of testability
integrated circuits. This family of devices supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of
complex circuit assemblies. Unlike most other devices of this family, the eTBCs are not boundary-scannable
devices; rather, their function is to master an IEEE Std 1149.1 (JTAG) test access port (TAP) under the command
of an embedded host microprocessor/microcontroller. Thus, the eTBCs enable the practical and effective use
of the IEEE Std 1149.1 test-access infrastructure to support embedded/built-in test, emulation, and
configuration/maintenance facilities at board and system levels.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright 2004, Texas Instruments Incorporated
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