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100352DMQB/NOPB PDF预览

100352DMQB/NOPB

更新时间: 2024-02-04 03:03:17
品牌 Logo 应用领域
德州仪器 - TI 驱动输出元件逻辑集成电路
页数 文件大小 规格书
8页 56K
描述
100K SERIES, 8-BIT DRIVER, TRUE OUTPUT, CDIP24, 0.400 INCH, CERDIP-24

100352DMQB/NOPB 技术参数

是否Rohs认证: 符合生命周期:Obsolete
包装说明:DIP,Reach Compliance Code:compliant
风险等级:5.73其他特性:WITH 25 OHM LINE DRIVE CAPABILITY
系列:100KJESD-30 代码:R-GDIP-T24
负载电容(CL):3 pF逻辑集成电路类型:BUS DRIVER
湿度敏感等级:1位数:8
功能数量:1端口数量:2
端子数量:24最高工作温度:125 °C
最低工作温度:-55 °C输出特性:OPEN-EMITTER WITH CUT-OFF
输出极性:TRUE封装主体材料:CERAMIC, GLASS-SEALED
封装代码:DIP封装形状:RECTANGULAR
封装形式:IN-LINE峰值回流温度(摄氏度):260
最大电源电流(ICC):150 mA传播延迟(tpd):2.7 ns
认证状态:Not Qualified筛选级别:MIL-STD-883 Class B
座面最大高度:5.72 mm表面贴装:NO
技术:ECL温度等级:MILITARY
端子形式:THROUGH-HOLE端子节距:2.54 mm
端子位置:DUAL处于峰值回流温度下的最长时间:NOT SPECIFIED
宽度:10.16 mmBase Number Matches:1

100352DMQB/NOPB 数据手册

 浏览型号100352DMQB/NOPB的Datasheet PDF文件第2页浏览型号100352DMQB/NOPB的Datasheet PDF文件第3页浏览型号100352DMQB/NOPB的Datasheet PDF文件第4页浏览型号100352DMQB/NOPB的Datasheet PDF文件第5页浏览型号100352DMQB/NOPB的Datasheet PDF文件第6页浏览型号100352DMQB/NOPB的Datasheet PDF文件第7页 
MICROCIRCUIT DATA SHEET  
Original Creation Date: 10/30/95  
Last Update Date: 08/24/98  
MN100352-X REV 1A0  
Last Major Revision Date: 08/03/98  
LOW POWER 8-BIT BUFFER WITH CUT-OFF DRIVERS  
General Description  
The F100352 contains an eight bit buffer, individual inputs (Dn), outputs (Qn), and a data  
output enable pin (OEN). A Q output follows its D input when the OEN pin is LOW. A HIGH  
on OEN holds the outputs in a cut-off state. The cut-off state is designed to be more  
negative than a normal ECL LOW level. This allows the output emitter- followers to turn  
off when the termination supply is -2.0V, presenting a high impedance to the data bus.  
This high impedance reduces termination power and prevents loss of low state noise margin  
when several loads share the bus.  
The F100352 outputs are designed to drive a doubly terminated 50 ohm transmission line (25  
ohm load impedance). All inputs have 50K ohms pull-down resistors.  
Industry Part Number  
NS Part Numbers  
100352  
100352DMQB  
100352FMQB  
Prime Die  
F352  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1

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