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TC7SH126FS PDF预览

TC7SH126FS

更新时间: 2024-11-21 04:28:47
品牌 Logo 应用领域
东芝 - TOSHIBA 总线驱动器总线收发器逻辑集成电路光电二极管
页数 文件大小 规格书
6页 152K
描述
Bus Buffer with 3-STATE Output

TC7SH126FS 技术参数

是否Rohs认证: 符合生命周期:Obsolete
零件包装代码:SON包装说明:VSOF, FL6,.03,14
针数:5Reach Compliance Code:unknown
HTS代码:8542.39.00.01风险等级:5.74
Is Samacsys:N控制类型:ENABLE HIGH
系列:LV/LV-A/LVX/HJESD-30 代码:R-PDSO-F5
JESD-609代码:e0长度:1 mm
负载电容(CL):50 pF逻辑集成电路类型:BUS DRIVER
最大I(ol):0.004 A位数:1
功能数量:1端口数量:2
端子数量:5最高工作温度:85 °C
最低工作温度:-40 °C输出特性:3-STATE
输出极性:TRUE封装主体材料:PLASTIC/EPOXY
封装代码:VSOF封装等效代码:FL6,.03,14
封装形状:RECTANGULAR封装形式:SMALL OUTLINE, VERY THIN PROFILE
电源:2/5.5 VProp。Delay @ Nom-Sup:13 ns
传播延迟(tpd):13 ns认证状态:Not Qualified
座面最大高度:0.5 mm子类别:Bus Driver/Transceivers
最大供电电压 (Vsup):5.5 V最小供电电压 (Vsup):2 V
标称供电电压 (Vsup):3.3 V表面贴装:YES
技术:CMOS温度等级:INDUSTRIAL
端子面层:TIN LEAD端子形式:FLAT
端子节距:0.35 mm端子位置:DUAL
宽度:0.8 mmBase Number Matches:1

TC7SH126FS 数据手册

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TC7SH126FS  
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic  
TC7SH126FS  
Bus Buffer with 3-STATE Output  
Features  
High speed: t = 3.8 ns (typ.) at V  
= 5 V, 15pF  
pd  
CC  
Low power dissipation: I  
= 2 μA (max) at Ta = 25°C  
CC  
High noise immunity: V  
= V  
= 28% V  
(min)  
NIH  
NIL  
CC  
Wide operating voltage range: V  
(opr.) = 2~5.5 V  
CC  
5.5-V tolerant input  
SON5-P-0.35  
(fSV)  
Weight: 0.001 g (typ.)  
Marking  
Pin Assignment (top view)  
Product name  
IN A 1  
5 V  
CC  
H X  
GND 2  
G 3  
4 OUT Y  
Absolute Maximum Ratings (Ta = 25°C)  
Characteristics  
Supply voltage range  
Symbol  
Rating  
0.5~7  
0.5~7  
Unit  
V
V
CC  
DC input voltage  
V
V
IN  
DC output voltage  
Input diode current  
Output diode current  
DC output current  
V
0.5~V  
+ 0.5  
V
OUT  
CC  
I
20  
mA  
mA  
mA  
mA  
mW  
°C  
IK  
I
±20  
±25  
OK  
I
OUT  
DC V /ground current  
CC  
I
±50  
CC  
Power dissipation  
P
50  
D
Storage temperature  
T
65~150  
stg  
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings and the operating ranges.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test  
report and estimated failure rate, etc).  
1
2007-11-01  

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