TC7S04F/FU
TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic
TC7S04F, TC7S04FU
Inverter
The TC7S04 is a high speed C2MOS Inverter fabricated with
silicon gate C2MOS technology.
TC7S04F
It achieves high speed operation similar to equivalent LSTTL
while maintaining the C2MOS low power dissipation.
The internal circuit is composed of 3 stages including buffer
output, which enables high noise immunity and stable output.
The input is equipped with protection circuits against static
discharge or transient excess voltage.
Output currents are 1/2 compared to TC74HC series models.
Features
TC7S04FU
•
•
•
•
•
•
•
High speed: t = 7 ns (typ.) at V = 5 V
pd CC
Low power dissipation: I = 1 μA (max) at Ta = 25°C
CC
High noise immunity: V
= V
NIL
= 28% V (min)
CC
NIH
Output drive capability: 5 LSTTL loads
Symmetrical output impedance: |I | = I = 2 mA (min)
OH
OL
∼
Balanced propagation delays: t
t
pLH
pHL
Wide operating voltage range: V
(opr) = 2 to 6 V
CC
Weight
SSOP5-P-0.95: 0.016 g (typ.)
SSOP5-P-0.65A: 0.006 g (typ.)
Absolute Maximum Ratings (Ta = 25°C)
Characteristics
Supply voltage range
Symbol
Rating
Unit
V
-0.5 to 7
V
V
CC
DC input voltage
V
-0.5 to V
+ 0.5
IN
CC
CC
DC output voltage
Input diode current
Output diode current
DC output current
V
-0.5 to V
+ 0.5
V
OUT
I
±20
mA
mA
mA
mA
mW
°C
IK
I
±20
±12.5
±25
OK
I
OUT
DC V /ground current
CC
I
CC
Power dissipation
P
200
D
Storage temperature range
Lead temperature (10 s)
T
-65 to 150
260
stg
T
°C
L
Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant
change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating
conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the
operating ranges.
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling
Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated
failure rate, etc).
Start of commercial production
1987-08
© 2001-2017
Toshiba Electronic Devices & Storage Corporation
2017-08-01
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