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SPD21N05L PDF预览

SPD21N05L

更新时间: 2024-11-11 22:42:47
品牌 Logo 应用领域
英飞凌 - INFINEON 晶体晶体管
页数 文件大小 规格书
8页 146K
描述
SIPMOS Power Transistor

SPD21N05L 技术参数

是否Rohs认证: 不符合生命周期:Obsolete
Reach Compliance Code:unknownECCN代码:EAR99
风险等级:5.36其他特性:LOGIC LEVEL COMPATIBLE
雪崩能效等级(Eas):90 mJ配置:SINGLE WITH BUILT-IN DIODE
最小漏源击穿电压:55 V最大漏极电流 (Abs) (ID):20 A
最大漏极电流 (ID):20 A最大漏源导通电阻:0.07 Ω
FET 技术:METAL-OXIDE SEMICONDUCTORJESD-30 代码:R-PSSO-G2
JESD-609代码:e0元件数量:1
端子数量:2工作模式:ENHANCEMENT MODE
最高工作温度:175 °C封装主体材料:PLASTIC/EPOXY
封装形状:RECTANGULAR封装形式:SMALL OUTLINE
峰值回流温度(摄氏度):NOT SPECIFIED极性/信道类型:N-CHANNEL
最大功率耗散 (Abs):55 W最大脉冲漏极电流 (IDM):80 A
认证状态:Not Qualified子类别:FET General Purpose Power
表面贴装:YES端子面层:Tin/Lead (Sn/Pb)
端子形式:GULL WING端子位置:SINGLE
处于峰值回流温度下的最长时间:NOT SPECIFIED晶体管应用:SWITCHING
晶体管元件材料:SILICONBase Number Matches:1

SPD21N05L 数据手册

 浏览型号SPD21N05L的Datasheet PDF文件第2页浏览型号SPD21N05L的Datasheet PDF文件第3页浏览型号SPD21N05L的Datasheet PDF文件第4页浏览型号SPD21N05L的Datasheet PDF文件第5页浏览型号SPD21N05L的Datasheet PDF文件第6页浏览型号SPD21N05L的Datasheet PDF文件第7页 
SPD21N05L  
SPU21N05L  
®
SIPMOS Power Transistor  
• N channel  
• Enhancement mode  
• Logic Level  
• Avalanche-rated  
• dv/dt rated  
Pin 1  
Pin 2  
Pin 3  
• 175°C operating temperature  
G
D
S
Type  
Package  
P-TO252  
P-TO251  
Ordering Code  
VDS  
ID  
RDS(on  
)
SPD21N05L  
SPU21N05L  
55 V  
55 V  
20 A  
20 A  
0.07  
0.07  
W
Q67040 - S4137- A2  
Q67040 - S4131 - A2  
W
Maximum Ratings  
Parameter  
Symbol  
Values  
Unit  
Continuous drain current  
I
A
D
T = 25 °C  
20  
14  
C
T = 100 °C  
C
Pulsed drain current  
I
Dpuls  
T = 25 °C  
80  
C
Avalanche energy, single pulse  
E
mJ  
AS  
W
I = 20 A, V = 25 V, R = 25  
D
DD  
GS  
L = 450 µH, T = 25 °C  
90  
20  
j
Avalanche current,limited by T  
I
A
jmax  
AR  
Avalanche energy,periodic limited by T  
E
5.5  
mJ  
jmax  
AR  
Reverse diode dv/dt  
dv/dt  
kV/µs  
I = 20 A, V = 40 V, di /dt = 200 A/µs  
S
DS  
F
T
= 175 °C  
6
jmax  
Gate source voltage  
Power dissipation  
V
±
14  
V
GS  
P
W
tot  
T = 25 °C  
55  
C
Semiconductor Group  
1
29/Jan/1998  

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