型号 | 品牌 | 替代类型 | 描述 | 数据表 |
SN74BCT760DWRG4 | TI |
完全替代 |
OCTAL BUFFERS/DRIVERS WITH OPEN-COLLECTOR OUTPUTS | |
SNJ54BCT760FK | TI |
完全替代 |
OCTAL BUFFERS/DRIVERS WITH OPEN-COLLECTOR OUTPUTS | |
SN54BCT760J | TI |
完全替代 |
OCTAL BUFFERS/DRIVERS WITH OPEN-COLLECTOR OUTPUTS |
型号 | 品牌 | 获取价格 | 描述 | 数据表 |
SNJ54BCT8240AFK | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS | |
SNJ54BCT8240AJT | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS | |
SNJ54BCT8244AFK | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUFFERS | |
SNJ54BCT8244AFKR | TI |
获取价格 |
暂无描述 | |
SNJ54BCT8244AJT | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUFFERS | |
SNJ54BCT8245AFK | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | |
SNJ54BCT8245AJT | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS | |
SNJ54BCT8373AFK | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | |
SNJ54BCT8373AJT | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES | |
SNJ54BCT8374AFK | TI |
获取价格 |
SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS |