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SN74SSTU32864D

更新时间: 2024-09-16 04:51:07
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描述
25-BIT CONFIGURABLE REGISTERED BUFFER WITH SSTL_18 INPUTS AND OUTPUTS

SN74SSTU32864D 数据手册

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SN74SSTU32864D  
25-BIT CONFIGURABLE REGISTERED BUFFER  
WITH SSTL_18 INPUTS AND OUTPUTS  
www.ti.com  
SCES623AFEBRUARY 2005REVISED APRIL 2005  
FEATURES  
Differential Clock (CLK and CLK) Inputs  
Member of the Texas Instruments Widebus+™  
Family  
Supports LVCMOS Switching Levels on  
Control and RESET Inputs  
Pinout Optimizes DDR2 DIMM PCB Layout  
RESET Input Disables Differential Input  
Receivers, Resets All Registers, and Forces  
All Outputs Low  
Configurable as 25-Bit 1:1 or 14-Bit 1:2  
Registered Buffer  
Latch-Up Performance Exceeds 100 mA Per  
JESD 78, Class II  
Chip-Select Inputs Gate Data Outputs From  
Changing State and Minimize System Power  
Consumption  
ESD Protection Exceeds JESD 22  
– 5000-V Human-Body Model (A114-A)  
– 150-V Machine Model (A115-A)  
Output Edge-Control Circuitry Minimizes  
Switching Noise in Unterminated Line  
Supports SSTL_18 Data Inputs  
– 1000-V Charged-Device Model (C101)  
DESCRIPTION/ORDERING INFORMATION  
This 25-bit 1:1 or 14-bit 1:2 configurable registered buffer is designed for 1.7-V to 1.9-V VCC operation. In the 1:1  
pinout configuration, only one device per DIMM is required to drive nine SDRAM loads. In the 1:2 pinout  
configuration, two devices per DIMM are required to drive 18 SDRAM loads.  
All inputs are SSTL_18, except the LVCMOS reset (RESET) and LVCMOS control (Cn) inputs. All outputs are  
edge-controlled circuits optimized for unterminated DIMM loads and meet SSTL_18 specifications.  
The SN74SSTU32864D operates from a differential clock (CLK and CLK). Data are registered at the crossing of  
CLK going high and CLK going low.  
The C0 input controls the pinout configuration of the 1:2 pinout from register-A configuration (when low) to  
register-B configuration (when high). The C1 input controls the pinout configuration from 25-bit 1:1 (when low) to  
14-bit 1:2 (when high). C0 and C1 should not be switched during normal operation. They should be hard-wired to  
a valid low or high level to configure the register in the desired mode. In the 25-bit 1:1 pinout configuration, the  
A6, D6, and H6 terminals are driven low and should not be used.  
In the DDR2 RDIMM application, RESET is specified to be completely asynchronous with respect to CLK and  
CLK. Therefore, no timing relationship can be ensured between the two. When entering reset, the register is  
cleared and the data outputs are driven low quickly, relative to the time to disable the differential input receivers.  
However, when coming out of reset, the register becomes active quickly, relative to the time required to enable  
the differential input receivers. As long as the data inputs are low, and the clock is stable during the time from the  
low-to-high transition of RESET until the input receivers are fully enabled, the design of the SN74SSTU32864D  
must ensure that the outputs remain low, thus ensuring no glitches on the output.  
To ensure defined outputs from the register before a stable clock has been supplied, RESET must be held in the  
low state during power up.  
ORDERING INFORMATION  
TA  
PACKAGE(1)  
Tape and reel  
Tape and reel  
ORDERABLE PART NUMBER  
SN74SSTU32864DGKER  
SN74SSTU32864DZKER  
TOP-SIDE MARKING  
LFBGA – GKE  
LFBGA – ZKE  
0°C to 70°C  
SU864D  
(1) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at  
www.ti.com/sc/package.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Widebus+ is a trademark of Texas Instruments.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2005, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  

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