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SN74LVTH574-EP PDF预览

SN74LVTH574-EP

更新时间: 2024-11-26 11:58:15
品牌 Logo 应用领域
德州仪器 - TI 触发器输出元件
页数 文件大小 规格书
9页 434K
描述
3.3-V ABT OCTAL EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH 3-STATE OUTPUTS

SN74LVTH574-EP 数据手册

 浏览型号SN74LVTH574-EP的Datasheet PDF文件第2页浏览型号SN74LVTH574-EP的Datasheet PDF文件第3页浏览型号SN74LVTH574-EP的Datasheet PDF文件第4页浏览型号SN74LVTH574-EP的Datasheet PDF文件第5页浏览型号SN74LVTH574-EP的Datasheet PDF文件第6页浏览型号SN74LVTH574-EP的Datasheet PDF文件第7页 
ꢌ ꢍꢌ ꢉꢅ ꢎꢏꢆ ꢐ ꢑꢆꢎꢄ ꢊꢒ ꢓꢊ ꢉꢆꢔ ꢕꢓ ꢓꢊ ꢔꢊꢒ ꢒꢉꢆ ꢖꢋ ꢊ ꢗ ꢄꢕ ꢋ ꢉꢗ ꢄꢐ  
SCBS774 − NOVEMBER 2003  
D
D
D
D
D
Controlled Baseline  
− One Assembly/Test Site, One Fabrication  
Site  
D
Bus Hold on Data Inputs Eliminates the  
Need for External Pullup/Pulldown  
Resistors  
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
D
D
Latch-Up Performance Exceeds 500 mA Per  
JESD 17  
Enhanced Product-Change Notification  
ESD Protection Exceeds JESD 22  
− 2000-V Human-Body Model (A114-A)  
− 200-V Machine Model (A115-A)  
Qualification Pedigree  
Supports Mixed-Mode Signal Operation  
(5-V Input and Output Voltages With 3.3-V  
PW PACKAGE  
(TOP VIEW)  
V
)
CC  
D
D
D
Supports Unregulated Battery Operation  
Down To 2.7 V  
1
2
3
4
5
6
7
8
9
10  
20  
19  
18  
17  
16  
15  
14  
13  
12  
11  
OE  
1D  
2D  
3D  
4D  
5D  
6D  
7D  
8D  
V
CC  
1Q  
2Q  
3Q  
4Q  
5Q  
6Q  
7Q  
8Q  
CLK  
Typical V  
<0.8 V at V  
(Output Ground Bounce)  
OLP  
CC  
= 3.3 V, T = 25°C  
A
I
and Power-Up 3-State Support Hot  
off  
Insertion  
Component qualification in accordance with JEDEC and industry  
standards to ensure reliable operation over an extended  
temperature range. This includes, but is not limited to, Highly  
Accelerated Stress Test (HAST) or biased 85/85, temperature  
cycle, autoclave or unbiased HAST, electromigration, bond  
intermetallic life, and mold compound life. Such qualification  
testing should not be viewed as justifying use of this component  
beyond specified performance and environmental limits.  
GND  
description/ordering information  
This octal flip-flop is designed specifically for low-voltage (3.3-V) V  
a TTL interface to a 5-V system environment.  
operation, but with the capability to provide  
CC  
The eight flip-flops of the SN74LVTH574 are edge-triggered D-type flip-flops. On the positive transition of the  
clock (CLK) input, the Q outputs are set to the logic levels set up at the data (D) inputs.  
A buffered output-enable (OE) input can be used to place the eight outputs in either a normal logic state (high  
or low logic levels) or a high-impedance state. In the high-impedance state, the outputs neither load nor drive  
the bus lines significantly. The high-impedance state and increased drive provide the capability to drive bus  
lines without need for interface or pullup components.  
OE does not affect the internal operations of the flip-flops. Old data can be retained or new data can be entered  
while the outputs are in the high-impedance state.  
To ensure the high-impedance state during power up or power down, OE should be tied to V  
resistor; the minimum value of the resistor is determined by the current-sinking capability of the driver.  
through a pullup  
CC  
ORDERING INFORMATION  
ORDERABLE  
PART NUMBER  
TOP-SIDE  
MARKING  
T
A
PACKAGE  
−40°C to 85°C  
TSSOP − PW Tape and reel  
SN74LVTH574IPWREP  
LH574EP  
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines  
are available at www.ti.com/sc/package.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
ꢆꢥ  
Copyright 2003, Texas Instruments Incorporated  
ꢡ ꢥ ꢢ ꢡꢚ ꢛꢮ ꢝꢜ ꢠ ꢨꢨ ꢦꢠ ꢞ ꢠ ꢟ ꢥ ꢡ ꢥ ꢞ ꢢ ꢍ  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  

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