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SCBS795 − DECEMBER 2003
D
D
D
D
D
Controlled Baseline
− One Assembly/Test Site, One Fabrication
Site
D
D
D
D
Member of the Texas Instruments
Widebus+ Family
Typical V
<0.8 V at V
(Output Ground Bounce)
OLP
CC
Enhanced Diminishing Manufacturing
Sources (DMS) Support
= 3.3 V, T = 25°C
A
I
and Power-Up 3-State Support Hot
off
Enhanced Product-Change Notification
Insertion
†
Qualification Pedigree
Supports Mixed-Mode Signal Operation on
All Ports (5-V Input and Output Voltages
State-of-the-Art Advanced BiCMOS
Technology (ABT) Design for 3.3-V
Operation and Low Static-Power
Dissipation
With 3.3-V V
)
CC
D
D
Bus Hold on Data Inputs Eliminates the
Need for External Pullup/Pulldown
Resistors
†
Component qualification in accordance with JEDEC and industry
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification
testing should not be viewed as justifying use of this component
beyond specified performance and environmental limits.
Supports Unregulated Battery Operation
Down To 2.7 V
GKE PACKAGE
(TOP VIEW)
terminal assignments
1
2
3
4
5
6
1
2
3
4
5
6
A
B
C
D
E
F
1Q2
1Q4
1Q6
1Q8
2Q2
2Q4
2Q6
2Q7
3Q2
3Q4
3Q6
3Q8
4Q2
4Q4
4Q6
4Q7
1Q1
1Q3
1Q5
1Q7
2Q1
2Q3
2Q5
2Q8
3Q1
3Q3
3Q5
3Q7
4Q1
4Q3
4Q5
4Q8
1OE
GND
1CLK
GND
1D1
1D3
1D5
1D7
2D1
2D3
2D5
2D8
3D1
3D3
3D5
3D7
4D1
4D3
4D5
4D8
1D2
1D4
1D6
1D8
2D2
2D4
2D6
2D7
3D2
3D4
3D6
3D8
4D2
4D4
4D6
4D7
A
B
C
D
E
F
1V
CC
1V
CC
GND
GND
GND
GND
1V
CC
1V
CC
G
H
J
GND
2OE
3OE
GND
GND
2CLK
3CLK
GND
G
H
J
K
L
K
L
2V
CC
2V
CC
M
N
P
R
T
GND
GND
GND
GND
M
N
P
R
T
2V
CC
2V
CC
GND
4OE
GND
4CLK
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Widebus+ is a trademark of Texas Instruments.
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Copyright 2003, Texas Instruments Incorporated
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1
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