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SN74LVTH32374-EP PDF预览

SN74LVTH32374-EP

更新时间: 2024-11-18 11:58:15
品牌 Logo 应用领域
德州仪器 - TI 触发器输出元件
页数 文件大小 规格书
13页 387K
描述
3.3-V ABT 32-BIT EDGE-TRIGGERED D-TYPE FLIP-FLOP WITH 3-STATE OUTPUTS

SN74LVTH32374-EP 数据手册

 浏览型号SN74LVTH32374-EP的Datasheet PDF文件第2页浏览型号SN74LVTH32374-EP的Datasheet PDF文件第3页浏览型号SN74LVTH32374-EP的Datasheet PDF文件第4页浏览型号SN74LVTH32374-EP的Datasheet PDF文件第5页浏览型号SN74LVTH32374-EP的Datasheet PDF文件第6页浏览型号SN74LVTH32374-EP的Datasheet PDF文件第7页 
ꢈ ꢍꢈ ꢊꢅ ꢎꢏꢆ ꢈ ꢉ ꢊꢏꢐ ꢆ ꢋꢑ ꢒꢋ ꢊꢆꢓ ꢐꢒ ꢒꢋ ꢓꢋꢑ ꢑꢊꢆ ꢔꢌ ꢋ ꢕ ꢄꢐ ꢌ ꢊꢕ ꢄꢖ  
SCBS795 − DECEMBER 2003  
D
D
D
D
D
Controlled Baseline  
− One Assembly/Test Site, One Fabrication  
Site  
D
D
D
D
Member of the Texas Instruments  
Widebus+Family  
Typical V  
<0.8 V at V  
(Output Ground Bounce)  
OLP  
CC  
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
= 3.3 V, T = 25°C  
A
I
and Power-Up 3-State Support Hot  
off  
Enhanced Product-Change Notification  
Insertion  
Qualification Pedigree  
Supports Mixed-Mode Signal Operation on  
All Ports (5-V Input and Output Voltages  
State-of-the-Art Advanced BiCMOS  
Technology (ABT) Design for 3.3-V  
Operation and Low Static-Power  
Dissipation  
With 3.3-V V  
)
CC  
D
D
Bus Hold on Data Inputs Eliminates the  
Need for External Pullup/Pulldown  
Resistors  
Component qualification in accordance with JEDEC and industry  
standards to ensure reliable operation over an extended  
temperature range. This includes, but is not limited to, Highly  
Accelerated Stress Test (HAST) or biased 85/85, temperature  
cycle, autoclave or unbiased HAST, electromigration, bond  
intermetallic life, and mold compound life. Such qualification  
testing should not be viewed as justifying use of this component  
beyond specified performance and environmental limits.  
Supports Unregulated Battery Operation  
Down To 2.7 V  
GKE PACKAGE  
(TOP VIEW)  
terminal assignments  
1
2
3
4
5
6
1
2
3
4
5
6
A
B
C
D
E
F
1Q2  
1Q4  
1Q6  
1Q8  
2Q2  
2Q4  
2Q6  
2Q7  
3Q2  
3Q4  
3Q6  
3Q8  
4Q2  
4Q4  
4Q6  
4Q7  
1Q1  
1Q3  
1Q5  
1Q7  
2Q1  
2Q3  
2Q5  
2Q8  
3Q1  
3Q3  
3Q5  
3Q7  
4Q1  
4Q3  
4Q5  
4Q8  
1OE  
GND  
1CLK  
GND  
1D1  
1D3  
1D5  
1D7  
2D1  
2D3  
2D5  
2D8  
3D1  
3D3  
3D5  
3D7  
4D1  
4D3  
4D5  
4D8  
1D2  
1D4  
1D6  
1D8  
2D2  
2D4  
2D6  
2D7  
3D2  
3D4  
3D6  
3D8  
4D2  
4D4  
4D6  
4D7  
A
B
C
D
E
F
1V  
CC  
1V  
CC  
GND  
GND  
GND  
GND  
1V  
CC  
1V  
CC  
G
H
J
GND  
2OE  
3OE  
GND  
GND  
2CLK  
3CLK  
GND  
G
H
J
K
L
K
L
2V  
CC  
2V  
CC  
M
N
P
R
T
GND  
GND  
GND  
GND  
M
N
P
R
T
2V  
CC  
2V  
CC  
GND  
4OE  
GND  
4CLK  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Widebus+ is a trademark of Texas Instruments.  
ꢆꢥ  
Copyright 2003, Texas Instruments Incorporated  
ꢡ ꢥ ꢢ ꢡꢚ ꢛꢮ ꢝꢜ ꢠ ꢨꢨ ꢦꢠ ꢞ ꢠ ꢟ ꢥ ꢡ ꢥ ꢞ ꢢ ꢍ  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  

SN74LVTH32374-EP 替代型号

型号 品牌 替代类型 描述 数据表
SN74LVTH32374 TI

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