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SN74LVTH32244-EP PDF预览

SN74LVTH32244-EP

更新时间: 2024-11-25 11:58:15
品牌 Logo 应用领域
德州仪器 - TI 驱动器输出元件
页数 文件大小 规格书
13页 388K
描述
3.3-V ABT 32-BIT BUFFER/DRIVER WITH 3-STATE OUTPUTS

SN74LVTH32244-EP 数据手册

 浏览型号SN74LVTH32244-EP的Datasheet PDF文件第2页浏览型号SN74LVTH32244-EP的Datasheet PDF文件第3页浏览型号SN74LVTH32244-EP的Datasheet PDF文件第4页浏览型号SN74LVTH32244-EP的Datasheet PDF文件第5页浏览型号SN74LVTH32244-EP的Datasheet PDF文件第6页浏览型号SN74LVTH32244-EP的Datasheet PDF文件第7页 
ꢀꢁꢂ ꢃ ꢄꢅꢆ ꢇ ꢈꢉ ꢉꢃ ꢃꢊ ꢋꢌ  
ꢈ ꢍꢈ ꢊꢅ ꢎꢏꢆ ꢈ ꢉ ꢊꢏꢐ ꢆ ꢏꢑꢒ ꢒ ꢋ ꢓꢔ ꢕꢓ ꢐ ꢅꢋ ꢓ  
ꢖ ꢐꢆ ꢇ ꢈ ꢊꢀꢆꢎꢆ ꢋ ꢗ ꢑꢆ ꢌ ꢑꢆꢀ  
SCBS793A − DECEMBER 2003 − REVISED JUNE 2004  
D
D
D
D
D
Controlled Baseline  
− One Assembly/Test Site, One Fabrication  
Site  
D
D
D
D
Typical V  
<0.8 V at V  
(Output Ground Bounce)  
OLP  
= 3.3 V, T = 25°C  
CC A  
I
and Power-Up 3-State Support Hot  
off  
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
Insertion  
Supports Unregulated Battery Operation  
Down To 2.7 V  
Enhanced Product-Change Notification  
Qualification Pedigree  
Supports Mixed-Mode Signal Operation  
(5-V Input and Output Voltages With  
Member of the Texas Instruments  
Widebus+Family  
3.3-V V  
)
CC  
D
Bus Hold on Data Inputs Eliminates the  
Need for External Pullup/Pulldown  
Resistors  
D
State-of-the-Art Advanced BiCMOS  
Technology (ABT) Design for 3.3-V  
Operation and Low Static-Power  
Dissipation  
D
D
Latch-Up Performance Exceeds 100 mA Per  
JESD 78, Class II  
Component qualification in accordance with JEDEC and industry  
standards to ensure reliable operation over an extended  
temperature range. This includes, but is not limited to, Highly  
Accelerated Stress Test (HAST) or biased 85/85, temperature  
cycle, autoclave or unbiased HAST, electromigration, bond  
intermetallic life, and mold compound life. Such qualification  
testing should not be viewed as justifying use of this component  
beyond specified performance and environmental limits.  
ESD Protection Exceeds JESD 22  
− 2000-V Human-Body Model (A114-A)  
− 200-V Machine Model (A115-A)  
− 1000-V Charged-Device Model (C101)  
GKE PACKAGE  
(TOP VIEW)  
terminal assignments  
1
2
3
4
5
6
1
2
3
4
5
6
A
B
C
D
E
F
1Y2  
1Y4  
2Y2  
2Y4  
3Y2  
3Y4  
4Y2  
4Y3  
5Y2  
5Y4  
6Y2  
6Y4  
7Y2  
7Y4  
8Y2  
8Y3  
1Y1  
1Y3  
2Y1  
2Y3  
3Y1  
3Y3  
4Y1  
4Y4  
5Y1  
5Y3  
6Y1  
6Y3  
7Y1  
7Y3  
8Y1  
8Y4  
1OE  
GND  
2OE  
GND  
1A1  
1A3  
2A1  
2A3  
3A1  
3A3  
4A1  
4A4  
5A1  
5A3  
6A1  
6A3  
7A1  
7A3  
8A1  
8A4  
1A2  
1A4  
2A2  
2A4  
3A2  
3A4  
4A2  
4A3  
5A2  
5A4  
6A2  
6A4  
7A2  
7A4  
8A2  
8A3  
A
B
C
D
E
F
1V  
CC  
1V  
CC  
GND  
GND  
GND  
GND  
1V  
CC  
1V  
CC  
G
H
J
GND  
4OE  
5OE  
GND  
GND  
3OE  
6OE  
GND  
G
H
J
K
L
K
L
2V  
CC  
2V  
CC  
M
N
P
R
T
GND  
GND  
GND  
GND  
M
N
P
R
T
2V  
CC  
2V  
CC  
GND  
8OE  
GND  
7OE  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Widebus+ is a trademark of Texas Instruments.  
ꢆꢤ  
Copyright 2004, Texas Instruments Incorporated  
ꢠ ꢤ ꢡ ꢠꢙ ꢚꢭ ꢜꢛ ꢟ ꢧꢧ ꢥꢟ ꢝ ꢟ ꢞ ꢤ ꢠ ꢤ ꢝ ꢡ ꢍ  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  

SN74LVTH32244-EP 替代型号

型号 品牌 替代类型 描述 数据表
SN74LVTH32244 TI

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