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SN74LVTH182652A

更新时间： 2024-09-09 23:09:43

品牌	Logo	应用领域
德州仪器 - TI		测试
页数	文件大小	规格书
38页	602K
描述
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS

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SN74LVTH182652A 数据手册

SN54LVTH18652A, SN54LVTH182652A, SN74LVTH18652A, SN74LVTH182652A

3.3-V ABT SCAN TEST DEVICES

WITH 18-BIT TRANSCEIVERS AND REGISTERS

SCBS312C – MARCH 1994 – REVISED JUNE 1997

Members of the Texas Instruments

SCOPE Family of Testability Products

Compatible With the IEEE Std 1149.1-1990

(JTAG) Test Access Port and

Boundary-Scan Architecture

Members of the Texas Instruments

Widebus Family

SCOPE Instruction Set

– IEEE Std 1149.1-1990 Required

Instructions and Optional CLAMP and

HIGHZ

– Parallel-Signature Analysis at Inputs

– Pseudo-Random Pattern Generation

From Outputs

– Sample Inputs/Toggle Outputs

– Binary Count From Outputs

– Device Identification

State-of-the-Art 3.3-V ABT Design Supports

Mixed-Mode Signal Operation (5-V Input

and Output Voltages With 3.3-V V

)

Support Unregulated Battery Operation

Down to 2.7 V

Include D-Type Flip-Flops and Control

Circuitry to Provide Multiplexed

Transmission of Stored and Real-Time Data

Bus Hold on Data Inputs Eliminates the

Need for External Pullup/Pulldown

Resistors

– Even-Parity Opcodes

Packaged in 64-Pin Plastic Thin Quad Flat

(PM) Packages Using 0.5-mm

B-Port Outputs of ’LVTH182652A Devices

Have Equivalent 25-Ω Series Resistors, So

No External Resistors Are Required

Center-to-Center Spacings and 68-Pin

Ceramic Quad Flat (HV) Packages Using

25-mil Center-to-Center Spacings

description

The ’LVTH18652A and ’LVTH182652A scan test devices with 18-bit bus transceivers and registers are

members of the Texas Instruments (TI) SCOPE testability integrated-circuit family. This family of devices

supports IEEE Std 1149.1-1990 boundary scan to facilitate testing of complex circuit board assemblies. Scan

access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface.

Additionally, these devices are designed specifically for low-voltage (3.3-V) V

capability to provide a TTL interface to a 5-V system environment.

operation, but with the

In the normal mode, these devices are 18-bit bus transceivers and registers that allow for multiplexed

transmission of data directly from the input bus or from the internal registers. They can be used either as two

9-bit transceivers or one 18-bit transceiver. The test circuitry can be activated by the TAP to take snapshot

samples of the data appearing at the device pins or to perform a self test on the boundary-test cells. Activating

the TAP in the normal mode does not affect the functional operation of the SCOPE bus transceivers

and registers.

Data flow in each direction is controlled by clock (CLKAB and CLKBA), select (SAB and SBA), and

output-enable (OEAB and OEBA) inputs. For A-to-B data flow, data on the A bus is clocked into the associated

registers on the low-to-high transition of CLKAB. When SAB is low, real-time A data is selected for presentation

to the B bus (transparent mode). When SAB is high, stored A data is selected for presentation to the B bus

(registered mode). When OEAB is high, the B outputs are active. When OEAB is low, the B outputs are in the

high-impedance state.

Control for B-to-A data flow is similar to that for A-to-B data flow but uses CLKBA, SBA, and OEBA inputs. Since

the OEBA input is active-low, the A outputs are active when OEBA is low and are in the high-impedance state

when OEBA is high. Figure 1 illustrates the four fundamental bus-management functions that can be performed

with the ’LVTH18652A and ’LVTH182652A.

Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of

Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.

SCOPE and Widebus are trademarks of Texas Instruments Incorporated.

UNLESS OTHERWISE NOTED this document contains PRODUCTION

DATA information current as of publication date. Products conform to

specifications per the terms of Texas Instruments standard warranty.

Production processing does not necessarily include testing of all

parameters.

POST OFFICE BOX 655303 • DALLAS, TEXAS 75265

12 3 4 5 6 7...38

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与SN74LVTH182652A相关器件

型号	品牌	获取价格	描述	数据表
SN74LVTH182652APM	TI	获取价格	3.3-V ABT SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS
SN74LVTH18502A	TI	获取价格	3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN74LVTH18502A-EP	TI	获取价格	3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN74LVTH18502APM	TI	获取价格	3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN74LVTH18502APMG4	TI	获取价格	3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN74LVTH18502APMR	TI	获取价格	3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SN74LVTH18504A	TI	获取价格	3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN74LVTH18504APM	TI	获取价格	3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SN74LVTH18504APMG4	TI	获取价格	3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85
SN74LVTH18504APMR	TI	获取价格	3.3-V ABT SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS

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