是否Rohs认证: | 不符合 | 生命周期: | Obsolete |
零件包装代码: | TSSOP | 包装说明: | TSSOP, |
针数: | 64 | Reach Compliance Code: | not_compliant |
HTS代码: | 8542.31.00.01 | 风险等级: | 5.92 |
JESD-30 代码: | R-PDSO-G64 | 长度: | 17 mm |
端子数量: | 64 | 最高工作温度: | 85 °C |
最低工作温度: | -40 °C | 封装主体材料: | PLASTIC/EPOXY |
封装代码: | TSSOP | 封装形状: | RECTANGULAR |
封装形式: | SMALL OUTLINE, THIN PROFILE, SHRINK PITCH | 峰值回流温度(摄氏度): | NOT SPECIFIED |
认证状态: | Not Qualified | 座面最大高度: | 1.2 mm |
最大供电电压: | 3.6 V | 最小供电电压: | 2.7 V |
标称供电电压: | 3.3 V | 表面贴装: | YES |
技术: | CMOS | 温度等级: | INDUSTRIAL |
端子形式: | GULL WING | 端子节距: | 0.5 mm |
端子位置: | DUAL | 处于峰值回流温度下的最长时间: | NOT SPECIFIED |
宽度: | 6.1 mm | uPs/uCs/外围集成电路类型: | MICROPROCESSOR CIRCUIT |
Base Number Matches: | 1 |
型号 | 品牌 | 获取价格 | 描述 | 数据表 |
SN74LVT182512DGGR | TI |
获取价格 |
IC,BUS TRANSCEIVER,DUAL,9-BIT,LVT/ALVT-BICMOS,TSSOP,64PIN,PLASTIC | |
SN74LVT18502PM | TI |
获取价格 |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | |
SN74LVT18504 | TI |
获取价格 |
3.3-V ABT SCAN TEST DEVICE WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS | |
SN74LVT18504PM | TI |
获取价格 |
3.3-V ABT Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85 | |
SN74LVT18504PMLE | TI |
获取价格 |
LVT SERIES, 20-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PQFP64 | |
SN74LVT18512 | TI |
获取价格 |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | |
SN74LVT18512DGG | TI |
获取价格 |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | |
SN74LVT18512DGGR | TI |
获取价格 |
3.3-V ABT SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS | |
SN74LVT18652PMLE | TI |
获取价格 |
LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PQFP64 | |
SN74LVT240A | TI |
获取价格 |
3.3-V ABT OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS |