SN74LVC1G34
www.ti.com................................................................................................................................................... SCES519H–DECEMBER 2003–REVISED JULY 2008
SINGLE BUFFER GATE
1
FEATURES
2
•
Available in the Texas Instruments NanoFree™
Package
•
•
•
Ioff Supports Partial-Power-Down Mode
Operation
•
•
•
•
•
Supports 5-V VCC Operation
Inputs Accept Voltages to 5.5 V
Max tpd of 3.5 ns at 3.3 V
Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
ESD Protection Exceeds JESD 22
–
–
–
2000-V Human-Body Model (A114-A)
200-V Machine Model (A115-A)
Low Power Consumption, 1-µA Max ICC
±24-mA Output Drive at 3.3 V
1000-V Charged-Device Model (C101)
DBV PACKAGE
(TOP VIEW)
DCK PACKAGE
(TOP VIEW)
DRL PACKAGE
(TOP VIEW)
VCC
1
2
3
5
4
VCC
N.C.
A
1
2
3
5
N.C.
VCC
1
2
3
5
N.C.
A
A
GND
Y
4
GND
Y
4
GND
Y
See mechanical drawings for dimensions.
N.C. – No internal connection
YZP PACKAGE
(TOP VIEW)
YZP PACKAGE TERMINAL ASSIGNMENTS
1
2
VCC
No ball
Y
A1
B1
C1
A2
DNU
A
VCC
A
B
C
DNU
A
C2
GND
Y
GND
DNU – Do not use
YZV PACKAGE
(TOP VIEW)
YFP PACKAGE
(TOP VIEW)
YZV/YFP PACKAGE TERMINAL ASSIGNMENTS
B
A
GND
Y
VCC
2
A1
A2
A1 A2
A
VCC
Y
A
VCC
Y
A
B1 B2
GND
B1
B2
GND
1
DESCRIPTION/ORDERING INFORMATION
This single buffer gate is designed for 1.65-V to 5.5-V VCC operation. The SN74LVC1G34 performs the Boolean
function Y = A in positive logic.
NanoFree™ package technology is a major breakthrough in IC packaging concepts, using the die as the
package.
This device is fully specified for partial-power-down applications using Ioff. The Ioff circuitry disables the outputs,
preventing damaging current backflow through the device when it is powered down.
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
2
NanoFree is a trademark of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
Copyright © 2003–2008, Texas Instruments Incorporated