SN74LVC1G3157-Q1
www.ti.com ............................................................................................................................................................ SCES463E–JUNE 2003–REVISED APRIL 2008
SINGLE-POLE DOUBLE-THROW ANALOG SWITCH
1
FEATURES
•
Qualified for Automotive Applications
•
•
•
Rail-to-Rail Signal Handling
High Degree of Linearity
•
ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
High Speed, Typically 0.5 ns
(VCC = 3 V, CL = 50 pF)
•
•
1.65-V to 5.5-V VCC Operation
•
•
Low On-State Resistance, Typically ≈6 Ω
(VCC = 4.5 V)
Useful for Both Analog and Digital
Applications
Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
•
Specified Break-Before-Make Switching
DBV PACKAGE
(TOP VIEW)
DCK PACKAGE
(TOP VIEW)
1
2
3
6
5
4
B2
GND
B1
S
1
2
3
6
5
4
B2
GND
B1
S
VCC
VCC
A
A
See mechanical drawings for dimensions.
DESCRIPTION/ORDERING INFORMATION
This single-pole double-throw (SPDT) analog switch is designed for 1.65-V to 5.5-V VCC operation.
The SN74LVC1G3157 can handle both analog and digital signals. The device permits signals with amplitudes of
up to VCC (peak) to be transmitted in either direction.
Applications include signal gating, chopping, modulation or demodulation (modem), and signal multiplexing for
analog-to-digital and digital-to-analog conversion systems.
ORDERING INFORMATION(1)
TA
PACKAGE(2)
ORDERABLE PART NUMBER
1P1G3157QDBVRQ1
TOP-SIDE MARKING
SOT (SOT-23) – DBV
SOT (SC-70) – DCK
Reel of 3000
Reel of 3000
CC50
C50
–40°C to 125°C
1P1G3157QDCKRQ1
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
(2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.
FUNCTION TABLE
CONTROL
INPUTS
ON
CHANNEL
L
B1
B2
H
1
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PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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