SN74LVC126A
QUADRUPLE BUS BUFFER GATE
WITH 3-STATE OUTPUTS
SCAS339H – MARCH 1994 – REVISED OCTOBER 1998
D, DB, DGV, OR PW PACKAGE
(TOP VIEW)
EPIC (Enhanced-Performance Implanted
CMOS) Submicron Process
ESD Protection Exceeds 2000 V Per
MIL-STD-883, Method 3015; Exceeds 200 V
Using Machine Model (C = 200 pF, R = 0)
1OE
1A
V
CC
4OE
4A
1
2
3
4
5
6
7
14
13
12
11
1Y
Latch-Up Performance Exceeds 250 mA Per
JESD 17
2OE
2A
4Y
10 3OE
Typical V
< 0.8 V at V
(Output Ground Bounce)
9
8
2Y
3A
3Y
OLP
= 3.3 V, T = 25°C
CC
A
GND
Typical V
> 2 V at V
(Output V
Undershoot)
OHV
CC
OH
= 3.3 V, T = 25°C
A
Inputs Accept Voltages to 5.5 V
Package Options Include Plastic
Small-Outline (D), Shrink Small-Outline
(DB), Thin Very Small-Outline (DGV), and
Thin Shrink Small-Outline (PW) Packages
description
This quadruple bus buffer gate is designed for 1.65-V to 3.6-V V
operation.
CC
The SN74LVC126A features independent line drivers with 3-state outputs. Each output is disabled when the
associated output-enable (OE) input is low.
To ensure the high-impedance state during power up or power down, OE should be tied to GND through a
pulldown resistor; the minimum value of the resistor is determined by the current-sourcing capability of
the driver.
Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of these devices as translators
in a mixed 3.3-V/5-V system environment.
The SN74LVC126A is characterized for operation from –40°C to 85°C.
FUNCTION TABLE
(each buffer)
INPUTS
OUTPUT
Y
OE
A
H
L
H
H
L
H
L
X
Z
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
EPIC is a trademark of Texas Instruments Incorporated.
Copyright 1998, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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