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SN74LVC07AQDRQ PDF预览

SN74LVC07AQDRQ

更新时间: 2024-11-20 03:08:23
品牌 Logo 应用领域
德州仪器 - TI 驱动器输出元件
页数 文件大小 规格书
9页 143K
描述
HEX BUFFER/DRIVER WITH OPEN-DRAIN OUTPUTS

SN74LVC07AQDRQ 数据手册

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SN74LVC07A-Q1  
HEX BUFFER/DRIVER  
WITH OPEN-DRAIN OUTPUTS  
www.ti.com  
SCAS783COCTOBER 2004REVISED DECEMBER 2007  
1
FEATURES  
D OR PW PACKAGE  
(TOP VIEW)  
Qualified for Automotive Applications  
Operates From 1.65 V to 3.6 V  
Inputs and Open-Drain Outputs Accept  
Voltages up to 5.5 V  
Latch-Up Performance Exceeds 250 mA Per  
JESD 17  
DESCRIPTION/ORDERING INFORMATION  
This hex buffer/driver is designed for 1.65-V to 3.6-V VCC operation.  
The outputs of the SN74LVC07A device are open drain and can be connected to other open-drain outputs to  
implement active-low wired-OR or active-high wired-AND functions. The maximum sink current is 24 mA.  
Inputs can be driven from 1.8-V, 2.5-V, 3.3-V (LVTTL), or 5-V (CMOS) devices. This feature allows the use of  
this device as a translator in a mixed-system environment.  
ORDERING INFORMATION(1)  
TA  
PACKAGE(2)  
Reel of 2500  
Reel of 2000  
ORDERABLE PART NUMBER  
SN74LVC07AQDRQ1  
TOP-SIDE MARKING  
LVC07AQ  
LVC07AQ  
SOIC – D  
–40°C to 125°C  
TSSOP – PW  
SN74LVC07AQPWRQ1  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
web site at www.ti.com.  
(2) Package drawings, thermal data, and symbolization are available at www.ti.com/packaging.  
FUNCTION TABLE  
(EACH BUFFER/DRIVER)  
INPUT  
A
OUTPUT  
Y
H
L
H
L
LOGIC DIAGRAM, EACH BUFFER/DRIVER (POSITIVE LOGIC)  
A
Y
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2004–2007, Texas Instruments Incorporated  

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