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SN74LVC00A-EP

更新时间： 2024-11-20 11:58:27
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QUADRUPLE 2-INPUT POSITIVE-NAND GATE

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SN74LVC00A-EP 数据手册

 浏览型号SN74LVC00A-EP的Datasheet PDF文件第2页浏览型号SN74LVC00A-EP的Datasheet PDF文件第3页浏览型号SN74LVC00A-EP的Datasheet PDF文件第4页浏览型号SN74LVC00A-EP的Datasheet PDF文件第5页浏览型号SN74LVC00A-EP的Datasheet PDF文件第6页浏览型号SN74LVC00A-EP的Datasheet PDF文件第7页 
SN74LVC00A-EP  
QUADRUPLE 2-INPUT POSITIVE-NAND GATE  
www.ti.com  
SCAS729B–NOVEMBER 2003–REVISED MARCH 2007  
FEATURES  
•
•
Typical VOLP (Output Ground Bounce)  
<0.8 V at VCC = 3.3 V, TA = 25°C  
•
Controlled Baseline  
Typical VOHV (Output VOH Undershoot)  
>2 V at VCC = 3.3 V, TA = 25°C  
–
One Assembly/Test Site, One Fabrication  
Site  
•
•
Extended Temperature Performance of –40°C  
to 125°C and –55°C to 125°C  
D OR PW PACKAGE  
(TOP VIEW)  
Enhanced Diminishing Manufacturing Sources  
(DMS) Support  
1
2
3
4
5
6
7
14  
13  
12  
11  
10  
9
1A  
1B  
V
CC  
4B  
4A  
4Y  
3B  
3A  
3Y  
•
•
•
Enhanced Product-Change Notification  
1Y  
2A  
2B  
2Y  
(1)  
Qualification Pedigree  
ESD Protection Exceeds 2000 V Per  
MIL-STD-883, Method 3015; Exceeds 200 V  
Using Machine Model (C = 200 pF, R = 0)  
8
GND  
•
•
•
Operates From 2 V to 3.6 V  
Inputs Accept Voltages to 5.5 V  
Max tpd of 4.3 ns at 3.3 V  
(1) Component qualification in accordance with JEDEC and  
industry standards to ensure reliable operation over an  
extended temperature range. This includes, but is not limited  
to, Highly Accelerated Stress Test (HAST) or biased 85/85,  
temperature cycle, autoclave or unbiased HAST,  
electromigration, bond intermetallic life, and mold compound  
life. Such qualification testing should not be viewed as  
justifying use of this component beyond specified  
performance and environmental limits.  
DESCRIPTION/ORDERING INFORMATION  
The SN74LVC00A quadruple 2-input positive-NAND gate is designed for 2.7-V to 3.6-V VCC operation.  
The device performs the Boolean function Y = A B or Y = A + B in positive logic.  
Inputs can be driven from either 3.3-V or 5-V devices. This feature allows the use of this device as a translator in  
a mixed 3.3-V/5-V system environment.  
ORDERING INFORMATION(1)  
TA  
PACKAGE(2)  
ORDERABLE PART NUMBER  
SN74LVC00AQDREP  
TOP-SIDE MARKING  
LVC00AE  
SOIC – D  
Reel of 2500  
–40 °C to 125 °C  
–55 °C to 125 °C  
TSSOP – PW  
TSSOP – PW  
Reel of 2000  
Reel of 2000  
SN74LVC00AQPWREP  
SN74LVC00AMPWREP  
LVC00AE  
LVC00AM  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
Web site at www.ti.com.  
(2) Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are available at  
www.ti.com/sc/package.  
FUNCTION TABLE  
(EACH GATE)  
INPUTS  
OUTPUT  
Y
A
H
L
B
H
X
L
L
H
H
X
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas  
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
PRODUCTION DATA information is current as of publication date.  
Copyright © 2003–2007, Texas Instruments Incorporated  
Products conform to specifications per the terms of the Texas  
On products compliant to MIL-PRF-38535, all parameters are  
Instruments standard warranty. Production processing does not  
tested unless otherwise noted. On all other products, production  
necessarily include testing of all parameters.  
processing does not necessarily include testing of all parameters.  
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SN74LVC00A-EP 替代型号

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