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ꢋ ꢌꢍꢊ ꢄꢉ ꢎ ꢈꢍꢁ ꢊꢏꢋ ꢊꢐ ꢀꢍ ꢋ ꢍꢅꢉ ꢈꢇꢁ ꢑ ꢒ ꢇꢋꢉ
SCLS564A − JANUARY 2004 − REVISED MAY 2004
D
Controlled Baseline
− One Assembly/Test Site, One Fabrication
Site
D
D
D
D
Typical V
<0.8 V at V = 3.3 V, T = 25°C
(Output Ground Bounce)
OLP
CC
A
Typical V
>2.3 V at V
(Output V
Undershoot)
OHV
OH
D
D
Extended Temperature Performance of
−40°C to 105°C
Enhanced Diminishing Manufacturing
Sources (DMS) Support
= 3.3 V, T = 25°C
CC A
Supports Mixed-Mode Voltage Operation on
All Ports
I
Supports Partial-Power-Down Mode
off
D
D
D
Enhanced Product-Change Notification
Operation
PW PACKAGE
(TOP VIEW)
†
Qualification Pedigree
2-V to 5.5-V V
Operation
CC
1
2
3
4
5
6
7
14
13
12
11
10
9
1A
1B
2A
2B
2C
2Y
V
CC
†
Component qualification in accordance with JEDEC and industry
standards to ensure reliable operation over an extended
temperature range. This includes, but is not limited to, Highly
Accelerated Stress Test (HAST) or biased 85/85, temperature
cycle, autoclave or unbiased HAST, electromigration, bond
intermetallic life, and mold compound life. Such qualification
testing should not be viewed as justifying use of this component
beyond specified performance and environmental limits.
1C
1Y
3C
3B
3A
3Y
8
GND
description/ordering information
This triple 3-input positive-AND gate is designed for 2-V to 5.5-V V
operation.
CC
Y + A • B • C or Y + A ) B ) C
The SN74LV11A performs the Boolean function
in positive logic.
This device is fully specified for partial-power-down applications using I . The I circuitry disables the outputs,
off
off
preventing damaging current backflow through the device when it is powered down.
ORDERING INFORMATION
ORDERABLE
PART NUMBER
TOP-SIDE
MARKING
‡
T
A
PACKAGE
−40°C to 105°C
TSSOP − PW Tape and reel
SN74LV11ATPWREP
LV11AEP
‡
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design
guidelines are available at www.ti.com/sc/package.
FUNCTION TABLE
(each gate)
INPUTS
OUTPUT
Y
A
H
L
B
H
X
L
C
H
X
X
L
H
L
L
L
X
X
X
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
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Copyright 2004, Texas Instruments Incorporated
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