SN54273, SN54LS273, SN74273, SN74LS273
OCTAL D-TYPE FLIP-FLOP WITH CLEAR
SDLS090 – OCTOBER 1976 – REVISED MARCH 1988
SN54273, SN74LS273 . . . J OR W PACKAGE
SN74273 . . . N PACKAGE
• Contains Eight Flip-Flops With Single-Rail
Outputs
SN74LS273 . . . DW OR N PACKAGE
(TOP VIEW)
• Buffered Clock and Direct Clear Inputs
• Individual Data Input to Each Flip-Flop
• Applications Include:
Buffer/Storage Registers
Shift Registers
CLR
1Q
1D
2D
2Q
3Q
3D
4D
4Q
V
CC
1
2
3
4
5
6
7
8
9
10
20
19
18
17
8Q
8D
7D
Pattern Generators
16 7Q
15 6Q
description
14
13
12
11
6D
5D
5Q
CLK
These monolithic, positive-edge-triggered flip-
flops utilize TTL circuitry to implement D-type
flip-flop logic with a direct clear input.
GND
Information at the D inputs meeting the setup time
requirements is transferred to the Q outputs on the
positive-going edge of the clock pulse. Clock
triggering occurs at a particular voltage level and
is not directly related to the transition time of the
positive-going pulse. When the clock input is at
either the high or low level, the D input signal has
no effect ar the output.
SN54LS273 . . . FK PACKAGE
(TOP VIEW)
3
2
1
20 19
18
8D
7D
7Q
6Q
6D
2D
2Q
3Q
3D
4D
4
5
6
7
8
These flip-flops are guaranteed to respond to
clock frequencies ranging form 0 to 30 megahertz
while maximum clock frequency is typically 40
megahertz. Typical power dissipation is 39
milliwatts per flip-flop for the ′273 and 10 milliwatts
for the ′LS273.
17
16
15
14
9 10 11 12 13
†
FUNCTION TABLE
(each flip-flop)
logic symbol
INPUTS
1
CLR
OUTPUT
Q
EN
C1
CLEAR CLOCK
D
X
H
L
11
CLK
L
H
H
H
X
↑
L
H
L
3
1D
4
2
5
6
1D
1Q
2Q
3Q
4Q
5Q
6Q
7Q
8Q
↑
2D
7
L
X
Q
0
3D
8
9
4D
13
5D
14
6D
17
7D
18
8D
12
15
16
19
†
This symbol is in accordance with ANSI/IEEE Std.
91-1984 and IEC Publication 617-12.
Pin numbers shown are for the DW, J, N, and W packages.
Copyright 1988, Texas Instruments Incorporated
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
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