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SN74HCT244QPWREP

更新时间： 2024-11-24 12:21:51
品牌 Logo 应用领域
德州仪器 - TI 总线驱动器总线收发器逻辑集成电路光电二极管输出元件
页数 文件大小 规格书
10页 499K
描述
OCTAL BUFFER AND LINE DRIVER WITH 3-STATE OUTPUTS

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中文翻译

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SN74HCT244QPWREP 技术参数

是否无铅： 不含铅是否Rohs认证： 符合
生命周期：Active零件包装代码：TSSOP
包装说明：TSSOP, TSSOP20,.25针数：20
Reach Compliance Code：compliantECCN代码：EAR99
HTS代码：8542.39.00.01风险等级：0.69
控制类型：ENABLE LOW计数方向：UNIDIRECTIONAL
系列：HCTJESD-30 代码：R-PDSO-G20
JESD-609代码：e4长度：6.5 mm
负载电容（CL）：50 pF逻辑集成电路类型：BUS DRIVER
最大I（ol）：0.006 A湿度敏感等级：1
位数：4功能数量：2
端口数量：2端子数量：20
最高工作温度：125 °C最低工作温度：-40 °C
输出特性：3-STATE输出极性：TRUE
封装主体材料：PLASTIC/EPOXY封装代码：TSSOP
封装等效代码：TSSOP20,.25封装形状：RECTANGULAR
封装形式：SMALL OUTLINE, THIN PROFILE, SHRINK PITCH包装方法：TR
峰值回流温度（摄氏度）：260电源：5 V
最大电源电流（ICC）：0.16 mAProp。Delay @ Nom-Sup：42 ns
传播延迟（tpd）：68 ns认证状态：Not Qualified
座面最大高度：1.2 mm子类别：Bus Driver/Transceivers
最大供电电压 (Vsup)：5.5 V最小供电电压 (Vsup)：4.5 V
标称供电电压 (Vsup)：5 V表面贴装：YES
技术：CMOS温度等级：AUTOMOTIVE
端子面层：Nickel/Palladium/Gold (Ni/Pd/Au)端子形式：GULL WING
端子节距：0.65 mm端子位置：DUAL
处于峰值回流温度下的最长时间：NOT SPECIFIED翻译：N/A
宽度：4.4 mmBase Number Matches：1

SN74HCT244QPWREP 数据手册

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SCLS562 − JANUARY 2004  
D
Controlled Baseline  
− One Assembly/Test Site, One Fabrication  
Site  
D
D
D
D
D
Typical t = 13 ns  
pd  
6-mA Output Drive at 5 V  
Low Input Current of 1 µA Max  
Inputs Are TTL-Voltage Compatible  
D
D
Extended Temperature Performance of  
−40°C to 125°C  
Enhanced Diminishing Manufacturing  
Sources (DMS) Support  
3-State Outputs Drive Bus Lines or Buffer  
Memory Address Registers  
D
D
D
D
Enhanced Product-Change Notification  
PW PACKAGE  
(TOP VIEW)  
†
Qualification Pedigree  
Operating Voltage Range of 4.5 V to 5.5 V  
1OE  
1A1  
2Y4  
1A2  
2Y3  
1A3  
2Y2  
1A4  
2Y1  
V
CC  
1
2
3
4
5
6
7
8
9
20  
19  
18  
17  
High-Current Outputs Drive Up To 15  
LSTTL Loads  
2OE  
1Y1  
2A4  
D
Low Power Consumption, 160-µA Max I  
CC  
†
Component qualification in accordance with JEDEC and industry  
standards to ensure reliable operation over an extended  
temperature range. This includes, but is not limited to, Highly  
Accelerated Stress Test (HAST) or biased 85/85, temperature  
cycle, autoclave or unbiased HAST, electromigration, bond  
intermetallic life, and mold compound life. Such qualification  
testing should not be viewed as justifying use of this component  
beyond specified performance and environmental limits.  
16 1Y2  
2A3  
15  
14 1Y3  
13 2A2  
12 1Y4  
11 2A1  
GND 10  
description/ordering information  
This octal buffer and line driver is designed specifically to improve both the performance and density of 3-state  
memory address drivers, clock drivers, and bus-oriented receivers and transmitters. The SN74HCT244 device  
is organized as two 4-bit buffers/drivers, with separate output-enable (OE) inputs. When OE is low, the device  
passes noninverted data from the A inputs to the Y outputs. When OE is high, the outputs are in the  
high-impedance state.  
ORDERING INFORMATION  
ORDERABLE  
PART NUMBER  
TOP-SIDE  
MARKING  
‡
T
A
PACKAGE  
−40°C to 125°C  
TSSOP − PW Tape and reel  
SN74HCT244QPWREP  
SHT244EP  
‡
Package drawings, standard packing quantities, thermal data, symbolization, and PCB design guidelines are  
available at www.ti.com/sc/package.  
FUNCTION TABLE  
(each buffer/driver)  
INPUTS  
OUTPUT  
Y
OE  
A
H
L
L
L
H
L
H
X
Z
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
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Copyright 2004, Texas Instruments Incorporated  
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1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265  
1234567...10

中文翻译

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SN74HCT244QPWREP 替代型号

型号 品牌 替代类型 描述 数据表
SN74HCT244PWT TI

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SN74HCT244PWR TI

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 OCTAL BUFFERS AND LINE DRIVERS WITH 3-STATE OUTPUTS
SN74HCT244PW TI

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 OCTAL BUFFERS AND LINE DRIVERS WITH 3-STATE OUTPUTS

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