Datasheet > SN74HCS00BQA-Q1

SN74HCS00BQA-Q1

更新时间： 2024-11-27 02:50:31

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德州仪器 - TI		栅
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描述
SN74HCS00-Q1 Automotive Quadruple 2-Input NAND Gates with Schmitt-Trigger Inputs

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SN74HCS00BQA-Q1 数据手册

SN74HCS00-Q1

SCLS758C – JULY 2019 – REVISED MARCH 2021

SN74HCS00-Q1 Automotive Quadruple 2-Input NAND Gates with Schmitt-Trigger

Inputs

1 Features

3 Description

•

AEC-Q100 Qualified for automotive applications:

– Device temperature grade 1:

–40°C to +125°C, T_A

This device contains four independent 2-input NAND

Gates with Schmitt-trigger inputs. Each gate performs

the Boolean function Y = A ● B in positive logic.

– Device HBM ESD Classification Level 2

– Device CDM ESD Classifcation Level C6

Wide operating voltage range: 2 V to 6 V

Schmitt-trigger inputs allow for slow or noisy input

signals

Device Information

PART NUMBER

PACKAGE⁽¹⁾

TSSOP (14)

SOIC (14)

BODY SIZE (NOM)

5.00 mm × 4.40 mm

9.90 mm × 3.90 mm

3.00 mm × 2.50 mm

•

SN74HCS00PW-Q1

SN74HCS00D-Q1

SN74HCS00BQA-Q1 WQFN (14)

•

Low power consumption

(1) For all available packages, see the orderable addendum at

the end of the data sheet.

– Typical I_CCof 100 nA

– Typical input leakage current of ±100 nA

±7.8-mA output drive at 6 V

•

2 Applications

•

Alarm / tamper detect circuit

S-R latch

Supports Slow Inputs

Low Power

Noise Rejection

Input Voltage

Waveforms

Time

Input Voltage

Time

Standard

CMOS Input

Response

Waveforms

Time

Input Voltage

Schmitt-trigger

CMOS Input

Response

Waveforms

Time

Input Voltage

Benefits of Schmitt-trigger inputs

An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,

intellectual property matters and other important disclaimers. PRODUCTION DATA.

12 3 4 5 6 7...27

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